Daily Papers

Segmentation-based, two-stage neural network has shown excellent results in the surface defect detection, enabling the network to learn from a relatively small number of samples. In this work, we introduce end-to-end training of the two-stage network together with several extensions to the training process, which reduce the amount of training time and improve the results on the surface defect detection tasks. To enable end-to-end training we carefully balance the contributions of both the segmentation and the classification loss throughout the learning. We adjust the gradient flow from the classification into the segmentation network in order to prevent the unstable features from corrupting the learning. As an additional extension to the learning, we propose frequency-of-use sampling scheme of negative samples to address the issue of over- and under-sampling of images during the training, while we employ the distance transform algorithm on the region-based segmentation masks as weights for positive pixels, giving greater importance to areas with higher probability of presence of defect without requiring a detailed annotation. We demonstrate the performance of the end-to-end training scheme and the proposed extensions on three defect detection datasets - DAGM, KolektorSDD and Severstal Steel defect dataset - where we show state-of-the-art results. On the DAGM and the KolektorSDD we demonstrate 100\% detection rate, therefore completely solving the datasets. Additional ablation study performed on all three datasets quantitatively demonstrates the contribution to the overall result improvements for each of the proposed extensions.

Software testing is a crucial phase in the software life cycle, helping identify potential risks and reduce maintenance costs. With the advancement of Large Language Models (LLMs), researchers have proposed an increasing number of LLM-based software testing techniques, particularly in the area of test case generation. Despite the growing interest, limited efforts have been made to thoroughly evaluate the actual capabilities of LLMs in this task. In this paper, we introduce TestBench, a benchmark for class-level LLM-based test case generation. We construct a dataset of 108 Java programs from 9 real-world, large-scale projects on GitHub, each representing a different thematic domain. We then design three distinct types of prompts based on context descriptions, including self-contained context, full context, and simple context. Besides, we propose a fine-grained evaluation framework that considers five aspects of test cases: syntactic correctness, compilation correctness, test correctness, code coverage rate, and defect detection rate. Furthermore, we propose a heuristic algorithm to repair erroneous test cases generated by LLMs. We evaluate CodeLlama-13b, GPT-3.5, and GPT-4 on the TestBench, and our experimental results indicate that larger models demonstrate a greater ability to effectively utilize contextual information, thus generating higher-quality test cases. Smaller models may struggle with the noise introduced by the extensive information contained within the full context. However, when using the simplified version, namely the simple context, which is derived from the full context via abstract syntax tree analysis, the performance of these models improves significantly. Our analysis highlights the current progress and pinpoints future directions to further enhance the effectiveness of models by handling contextual information for test case generation.

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct type of defect, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not without providing any insights on the defect type, nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual- and textual representation in a joint feature space. To the best of our knowledge, our proposal, is the first approach to perform a multi-type anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD and Real-IAD.

With the growing use of information technology in all life domains, hacking has become more negatively effective than ever before. Also with developing technologies, attacks numbers are growing exponentially every few months and become more sophisticated so that traditional IDS becomes inefficient detecting them. This paper proposes a solution to detect not only new threats with higher detection rate and lower false positive than already used IDS, but also it could detect collective and contextual security attacks. We achieve those results by using Networking Chatbot, a deep recurrent neural network: Long Short Term Memory (LSTM) on top of Apache Spark Framework that has an input of flow traffic and traffic aggregation and the output is a language of two words, normal or abnormal. We propose merging the concepts of language processing, contextual analysis, distributed deep learning, big data, anomaly detection of flow analysis. We propose a model that describes the network abstract normal behavior from a sequence of millions of packets within their context and analyzes them in near real-time to detect point, collective and contextual anomalies. Experiments are done on MAWI dataset, and it shows better detection rate not only than signature IDS, but also better than traditional anomaly IDS. The experiment shows lower false positive, higher detection rate and better point anomalies detection. As for prove of contextual and collective anomalies detection, we discuss our claim and the reason behind our hypothesis. But the experiment is done on random small subsets of the dataset because of hardware limitations, so we share experiment and our future vision thoughts as we wish that full prove will be done in future by other interested researchers who have better hardware infrastructure than ours.

Deep neural networks (DNNs) are known to be vulnerable to adversarial attacks even under a black-box setting where the adversary can only query the model. Particularly, query-based black-box adversarial attacks estimate adversarial gradients based on the returned probability vectors of the target model for a sequence of queries. During this process, the queries made to the target model are intermediate adversarial examples crafted at the previous attack step, which share high similarities in the pixel space. Motivated by this observation, stateful detection methods have been proposed to detect and reject query-based attacks. While demonstrating promising results, these methods either have been evaded by more advanced attacks or suffer from low efficiency in terms of the number of shots (queries) required to detect different attacks. Arguably, the key challenge here is to assign high similarity scores for any two intermediate adversarial examples perturbed from the same clean image. To address this challenge, we propose a novel Adversarial Contrastive Prompt Tuning (ACPT) method to robustly fine-tune the CLIP image encoder to extract similar embeddings for any two intermediate adversarial queries. With ACPT, we further introduce a detection framework AdvQDet that can detect 7 state-of-the-art query-based attacks with >99% detection rate within 5 shots. We also show that ACPT is robust to 3 types of adaptive attacks. Code is available at https://github.com/xinwong/AdvQDet.

As large language models (LLMs) move from research prototypes to enterprise systems, their security vulnerabilities pose serious risks to data privacy and system integrity. This study benchmarks various Llama model variants against the OWASP Top 10 for LLM Applications framework, evaluating threat detection accuracy, response safety, and computational overhead. Using the FABRIC testbed with NVIDIA A30 GPUs, we tested five standard Llama models and five Llama Guard variants on 100 adversarial prompts covering ten vulnerability categories. Our results reveal significant differences in security performance: the compact Llama-Guard-3-1B model achieved the highest detection rate of 76% with minimal latency (0.165s per test), whereas base models such as Llama-3.1-8B failed to detect threats (0% accuracy) despite longer inference times (0.754s). We observe an inverse relationship between model size and security effectiveness, suggesting that smaller, specialized models often outperform larger general-purpose ones in security tasks. Additionally, we provide an open-source benchmark dataset including adversarial prompts, threat labels, and attack metadata to support reproducible research in AI security, [1].

Software is prone to security vulnerabilities. Program analysis tools to detect them have limited effectiveness in practice due to their reliance on human labeled specifications. Large language models (or LLMs) have shown impressive code generation capabilities but they cannot do complex reasoning over code to detect such vulnerabilities especially since this task requires whole-repository analysis. We propose IRIS, a neuro-symbolic approach that systematically combines LLMs with static analysis to perform whole-repository reasoning for security vulnerability detection. Specifically, IRIS leverages LLMs to infer taint specifications and perform contextual analysis, alleviating needs for human specifications and inspection. For evaluation, we curate a new dataset, CWE-Bench-Java, comprising 120 manually validated security vulnerabilities in real-world Java projects. A state-of-the-art static analysis tool CodeQL detects only 27 of these vulnerabilities whereas IRIS with GPT-4 detects 55 (+28) and improves upon CodeQL's average false discovery rate by 5% points. Furthermore, IRIS identifies 4 previously unknown vulnerabilities which cannot be found by existing tools. IRIS is available publicly at https://github.com/iris-sast/iris.

The upcoming space-based gravitational wave (GW) observatory, LISA, is expected to detect GW signals from supermassive black hole (SMBH) mergers occurring at high redshifts. However, understanding the origin and growth of SMBHs in the early Universe remains an open problem in astrophysics. In this work, we utilize the First Light And Reionization Epoch Simulations (FLARES), a suite of cosmological hydrodynamical zoom-in simulations, to study SMBH mergers at 5 lesssim z lesssim 10 across a wide range of environments. Most mergers in FLARES involve secondary SMBHs near the seed mass (m_{seed} approx 1.5 times 10^{5} M_{odot}) while primary SMBHs span up to 10^{9} M_{odot}, resulting in mass ratios from q sim 10^{-4} to 1, with a peak at q sim 1. The number of mergers increases rapidly towards lower redshifts, and the comoving total number density scales with overdensity as n_{merger} = 10^{-3.80} (1 + delta)^{4.56}. Denser regions host more massive mergers, with higher merger redshifts and lower mass ratios. Within the FLARES redshift range, LISA is expected to detect mergers with 10^{5} lesssim M_{tot} / M_{odot} lesssim 10^{8} and q gtrsim 10^{-2}, corresponding to a detection rate of 0.030 yr^{-1} for events with signal-to-noise ratio SNR geq 10. Our study demonstrates the sensitivity of GW predictions at high redshifts to SMBH seed models and merger time delays, highlighting the need for improved modeling in future cosmological simulations to maximize LISA's scientific return.

Currently, Audio Language Models (ALMs) are rapidly advancing due to the developments in large language models and audio neural codecs. These ALMs have significantly lowered the barrier to creating deepfake audio, generating highly realistic and diverse types of deepfake audio, which pose severe threats to society. Consequently, effective audio deepfake detection technologies to detect ALM-based audio have become increasingly critical. This paper investigate the effectiveness of current countermeasure (CM) against ALM-based audio. Specifically, we collect 12 types of the latest ALM-based deepfake audio and utilizing the latest CMs to evaluate. Our findings reveal that the latest codec-trained CM can effectively detect ALM-based audio, achieving 0% equal error rate under most ALM test conditions, which exceeded our expectations. This indicates promising directions for future research in ALM-based deepfake audio detection.

Fake base stations (FBSes) pose a significant security threat by impersonating legitimate base stations (BSes). Though efforts have been made to defeat this threat, up to this day, the presence of FBSes and the multi-step attacks (MSAs) stemming from them can lead to unauthorized surveillance, interception of sensitive information, and disruption of network services. Therefore, detecting these malicious entities is crucial to ensure the security and reliability of cellular networks. Traditional detection methods often rely on additional hardware, rules, signal scanning, changing protocol specifications, or cryptographic mechanisms that have limitations and incur huge infrastructure costs. In this paper, we develop FBSDetector-an effective and efficient detection solution that can reliably detect FBSes and MSAs from layer-3 network traces using machine learning (ML) at the user equipment (UE) side. To develop FBSDetector, we create FBSAD and MSAD, the first-ever high-quality and large-scale datasets incorporating instances of FBSes and 21 MSAs. These datasets capture the network traces in different real-world cellular network scenarios (including mobility and different attacker capabilities) incorporating legitimate BSes and FBSes. Our novel ML framework, specifically designed to detect FBSes in a multi-level approach for packet classification using stateful LSTM with attention and trace level classification and MSAs using graph learning, can effectively detect FBSes with an accuracy of 96% and a false positive rate of 2.96%, and recognize MSAs with an accuracy of 86% and a false positive rate of 3.28%. We deploy FBSDetector as a real-world solution to protect end-users through a mobile app and validate it in real-world environments. Compared to the existing heuristic-based solutions that fail to detect FBSes, FBSDetector can detect FBSes in the wild in real-time.

The convergence of Information Technology and Operational Technology has exposed Industrial Control Systems (ICS) to multi-stage cyberattacks that traverse software, network, and physical process layers simultaneously. Although Provenance-based Intrusion Detection Systems (PIDS) are effective in Information Technology (IT) environments, their applicability to Industrial Cyber-Physical Systems (CPS) remains largely unexplored because of the absence of datasets that jointly capture host-level causal behavior, industrial network semantics, and physical process state. To address this gap, we design an open-source, Hardware-in-the-Loop (HIL) CPS testbed that replicates an industrial chemical reactor control architecture across the Purdue model layers. Using this testbed, we propose ProvICS, a multimodal provenance dataset purpose-built for CPS intrusion detection, which synchronously captures four streams: whole-system provenance graphs from the supervisory host and the resource-constrained PLC, decoded Modbus deep-packet inspection records, and physical process telemetry. The collection comprises a 48-hour benign phase and a 22-hour attack phase across four campaigns covering 20 ICS ATT&CK techniques over 32 attack events, ranging from reconnaissance to physical process manipulation. Comparative analysis shows that ProvICS is among the few existing ICS/CPS benchmarks with multi-host kernel-level provenance, real PLC hardware-in-the-loop execution, decoded Modbus traffic, physical process-state measurements, and auxiliary raw PCAP traces in a time-synchronized collection. Baseline detection further confirms that cross-modal fusion can detect all 32 labeled attack events (F1 = 0.913, false-positive rate (FPR) = 1.40%), demonstrating the dataset's ability to expose complementary attack signals across modalities and addressing a gap not covered by prior benchmarks.

Serverless computing is an emerging cloud paradigm with serverless functions at its core. While serverless environments enable software developers to focus on developing applications without the need to actively manage the underlying runtime infrastructure, they open the door to a wide variety of security threats that can be challenging to mitigate with existing methods. Existing security solutions do not apply to all serverless architectures, since they require significant modifications to the serverless infrastructure or rely on third-party services for the collection of more detailed data. In this paper, we present an extendable serverless security threat detection model that leverages cloud providers' native monitoring tools to detect anomalous behavior in serverless applications. Our model aims to detect compromised serverless functions by identifying post-exploitation abnormal behavior related to different types of attacks on serverless functions, and therefore, it is a last line of defense. Our approach is not tied to any specific serverless application, is agnostic to the type of threats, and is adaptable through model adjustments. To evaluate our model's performance, we developed a serverless cybersecurity testbed in an AWS cloud environment, which includes two different serverless applications and simulates a variety of attack scenarios that cover the main security threats faced by serverless functions. Our evaluation demonstrates our model's ability to detect all implemented attacks while maintaining a negligible false alarm rate.

Stealthy hardware Trojans (HTs) inserted during the fabrication of integrated circuits can bypass the security of critical infrastructures. Although researchers have proposed many techniques to detect HTs, several limitations exist, including: (i) a low success rate, (ii) high algorithmic complexity, and (iii) a large number of test patterns. Furthermore, the most pertinent drawback of prior detection techniques stems from an incorrect evaluation methodology, i.e., they assume that an adversary inserts HTs randomly. Such inappropriate adversarial assumptions enable detection techniques to claim high HT detection accuracy, leading to a "false sense of security." Unfortunately, to the best of our knowledge, despite more than a decade of research on detecting HTs inserted during fabrication, there have been no concerted efforts to perform a systematic evaluation of HT detection techniques. In this paper, we play the role of a realistic adversary and question the efficacy of HT detection techniques by developing an automated, scalable, and practical attack framework, ATTRITION, using reinforcement learning (RL). ATTRITION evades eight detection techniques across two HT detection categories, showcasing its agnostic behavior. ATTRITION achieves average attack success rates of 47times and 211times compared to randomly inserted HTs against state-of-the-art HT detection techniques. We demonstrate ATTRITION's ability to evade detection techniques by evaluating designs ranging from the widely-used academic suites to larger designs such as the open-source MIPS and mor1kx processors to AES and a GPS module. Additionally, we showcase the impact of ATTRITION-generated HTs through two case studies (privilege escalation and kill switch) on the mor1kx processor. We envision that our work, along with our released HT benchmarks and models, fosters the development of better HT detection techniques.

While real-world applications of reinforcement learning are becoming popular, the security and robustness of RL systems are worthy of more attention and exploration. In particular, recent works have revealed that, in a multi-agent RL environment, backdoor trigger actions can be injected into a victim agent (a.k.a. Trojan agent), which can result in a catastrophic failure as soon as it sees the backdoor trigger action. To ensure the security of RL agents against malicious backdoors, in this work, we propose the problem of Backdoor Detection in a multi-agent competitive reinforcement learning system, with the objective of detecting Trojan agents as well as the corresponding potential trigger actions, and further trying to mitigate their Trojan behavior. In order to solve this problem, we propose PolicyCleanse that is based on the property that the activated Trojan agents accumulated rewards degrade noticeably after several timesteps. Along with PolicyCleanse, we also design a machine unlearning-based approach that can effectively mitigate the detected backdoor. Extensive experiments demonstrate that the proposed methods can accurately detect Trojan agents, and outperform existing backdoor mitigation baseline approaches by at least 3% in winning rate across various types of agents and environments.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

We present the Wildland-fire Infrared Thermal (WIT-UAS) dataset for long-wave infrared sensing of crew and vehicle assets amidst prescribed wildland fire environments. While such a dataset is crucial for safety monitoring in wildland fire applications, to the authors' awareness, no such dataset focusing on assets near fire is publicly available. Presumably, this is due to the barrier to entry of collaborating with fire management personnel. We present two related data subsets: WIT-UAS-ROS consists of full ROS bag files containing sensor and robot data of UAS flight over the fire, and WIT-UAS-Image contains hand-labeled long-wave infrared (LWIR) images extracted from WIT-UAS-ROS. Our dataset is the first to focus on asset detection in a wildland fire environment. We show that thermal detection models trained without fire data frequently detect false positives by classifying fire as people. By adding our dataset to training, we show that the false positive rate is reduced significantly. Yet asset detection in wildland fire environments is still significantly more challenging than detection in urban environments, due to dense obscuring trees, greater heat variation, and overbearing thermal signal of the fire. We publicize this dataset to encourage the community to study more advanced models to tackle this challenging environment. The dataset, code and pretrained models are available at https://github.com/castacks/WIT-UAS-Dataset.

Recently there have been many shared tasks targeting the detection of generated text from Large Language Models (LLMs). However, these shared tasks tend to focus either on cases where text is limited to one particular domain or cases where text can be from many domains, some of which may not be seen during test time. In this shared task, using the newly released RAID benchmark, we aim to answer whether or not models can detect generated text from a large, yet fixed, number of domains and LLMs, all of which are seen during training. Over the course of three months, our task was attempted by 9 teams with 23 detector submissions. We find that multiple participants were able to obtain accuracies of over 99% on machine-generated text from RAID while maintaining a 5% False Positive Rate -- suggesting that detectors are able to robustly detect text from many domains and models simultaneously. We discuss potential interpretations of this result and provide directions for future research.

The usage of generative artificial intelligence (AI) tools based on large language models, including ChatGPT, Bard, and Claude, for text generation has many exciting applications with the potential for phenomenal productivity gains. One issue is authorship attribution when using AI tools. This is especially important in an academic setting where the inappropriate use of generative AI tools may hinder student learning or stifle research by creating a large amount of automatically generated derivative work. Existing plagiarism detection systems can trace the source of submitted text but are not yet equipped with methods to accurately detect AI-generated text. This paper introduces the idea of direct origin detection and evaluates whether generative AI systems can recognize their output and distinguish it from human-written texts. We argue why current transformer-based models may be able to self-detect their own generated text and perform a small empirical study using zero-shot learning to investigate if that is the case. Results reveal varying capabilities of AI systems to identify their generated text. Google's Bard model exhibits the largest capability of self-detection with an accuracy of 94\%, followed by OpenAI's ChatGPT with 83\%. On the other hand, Anthropic's Claude model seems to be not able to self-detect.

Synthetic insider threat benchmarks face a consistency problem: corpora generated without an external factual constraint cannot rule out cross-artifact contradictions. The CERT dataset -- the field's canonical benchmark -- is also static, lacks cross-surface correlation scenarios, and predates the LLM era. We present OrgForge-IT, a verifiable synthetic benchmark in which a deterministic simulation engine maintains ground truth and language models generate only surface prose, making cross-artifact consistency an architectural guarantee. The corpus spans 51 simulated days, 2,904 telemetry records at a 96.4% noise rate, and four detection scenarios designed to defeat single-surface and single-day triage strategies across three threat classes and eight injectable behaviors. A ten-model leaderboard reveals several findings: (1) triage and verdict accuracy dissociate - eight models achieve identical triage F1=0.80 yet split between verdict F1=1.0 and 0.80; (2) baseline false-positive rate is a necessary companion to verdict F1, with models at identical verdict accuracy differing by two orders of magnitude on triage noise; (3) victim attribution in the vishing scenario separates tiers - Tier A models exonerate the compromised account holder while Tier B models detect the attack but misclassify the victim; (4) rigid multi-signal thresholds structurally exclude single-surface negligent insiders, demonstrating the necessity of parallel, threat-class-specific triage pipelines; and (5) agentic software-engineering training acts as a force multiplier for multi-day temporal correlation, but only when paired with frontier-level parameter scale. Finally, prompt sensitivity analysis reveals that unstructured prompts induce vocabulary hallucination, motivating a two-track scoring framework separating prompt adherence from reasoning capability. OrgForge-IT is open source under the MIT license.

Large language models are increasingly deployed in multi-agent settings whose outcomes hinge on social intelligence, motivating evaluations of their interactive capabilities; yet existing studies remain overwhelmingly empirical, leaving us without a theoretical understanding of how agent interactions determine collective outcomes. To address this, we introduce Mini-Mafia, a four-player simplification of the social deduction game Mafia in which a fixed night phase reduces the game to a single critical exchange among a mafioso, a detective, and a villager. In this setting, we show that the mafia win-rate p is predicted by the analytical formula logit(p) = v times (m - d), where m, d, and v represent the mafioso's deception, the detective's disclosure, and the villager's detection capabilities. We turn this analytical framework into the Mini-Mafia Benchmark, where Bayesian inference over gameplay data yields per-model estimates of the intrinsic parameters m, d, and v. For I models, only 3I parameters suffice to predict the outcomes of all I^3 tournament combinations; and in 5-fold cross-validation the formula achieves a 76.6% Brier-score reduction over a random baseline. The benchmark also reveals counterintuitive results: Grok 3 Mini is the strongest detector and GPT-5 Mini the strongest discloser, both ahead of DeepSeek V3.1, Claude Opus 4, and Claude Sonnet 4; while Claude Sonnet 4 is the weakest detector, near random chance. Together, these results show that Mini-Mafia, a simple but nontrivial multi-agent system, admits an analytical description and serves as a principled benchmark for language model interactions.

Smart contracts are essential to decentralized finance (DeFi) and blockchain ecosystems but are increasingly vulnerable to exploits due to coding errors and complex attack vectors. Traditional static analysis tools and existing vulnerability detection methods often fail to address these challenges comprehensively, leading to high false-positive rates and an inability to detect dynamic vulnerabilities. This paper introduces SmartLLM, a novel approach leveraging fine-tuned LLaMA 3.1 models with Retrieval-Augmented Generation (RAG) to enhance the accuracy and efficiency of smart contract auditing. By integrating domain-specific knowledge from ERC standards and employing advanced techniques such as QLoRA for efficient fine-tuning, SmartLLM achieves superior performance compared to static analysis tools like Mythril and Slither, as well as zero-shot large language model (LLM) prompting methods such as GPT-3.5 and GPT-4. Experimental results demonstrate a perfect recall of 100% and an accuracy score of 70%, highlighting the model's robustness in identifying vulnerabilities, including reentrancy and access control issues. This research advances smart contract security by offering a scalable and effective auditing solution, supporting the secure adoption of decentralized applications.

Advancing face morphing attack techniques is crucial to anticipate evolving threats and develop robust defensive mechanisms for identity verification systems. This work introduces DCMorph, a dual-stream diffusion-based morphing framework that simultaneously operates at both identity conditioning and latent space levels. Unlike image-level methods suffering from blending artifacts or GAN-based approaches with limited reconstruction fidelity, DCMorph leverages identity-conditioned latent diffusion models through two mechanisms: (1) decoupled cross-attention interpolation that injects identity-specific features from both source faces into the denoising process, enabling explicit dual-identity conditioning absent in existing diffusion-based methods, and (2) DDIM inversion with spherical interpolation between inverted latent representations from both source faces, providing geometrically consistent initial latent representation that preserves structural attributes. Vulnerability analyses across four state-of-the-art face recognition systems demonstrate that DCMorph achieves the highest attack success rates compared to existing methods at both operational thresholds, while remaining challenging to detect by current morphing attack detection solutions.

This paper presents OpenCLAW-P2P v6.0, a comprehensive evolution of the decentralized collective-intelligence platform in which autonomous AI agents publish, peer-review, score, and iteratively improve scientific research papers without any human gatekeeper. Building on v5.0 foundations -- tribunal-gated publishing, multi-LLM granular scoring, calibrated deception detection, the Silicon Chess-Grid FSM, and the AETHER containerized inference engine -- this release introduces four major new subsystems: (1) a multi-layer paper persistence architecture with four storage tiers (in-memory cache, Cloudflare R2, Gun.js, GitHub) ensuring zero paper loss across redeployments; (2) a multi-layer retrieval cascade with automatic backfill reducing lookup latency from >3s to <50ms; (3) live reference verification querying CrossRef, arXiv, and Semantic Scholar during scoring to detect fabricated citations with >85% accuracy; and (4) a scientific API proxy providing rate-limited cached access to seven public databases. The platform operates with 14 real autonomous agents producing 50+ scored papers (word counts 2,072-4,073, leaderboard scores 6.4-8.1) alongside 23 labeled simulated citizens. We present honest production statistics, failure-mode analysis, a paper recovery protocol that salvaged 25 lost papers, and lessons learned from operating the system at scale. All pre-existing subsystems -- 17-judge multi-LLM scoring, 14-rule calibration with 8 deception detectors, tribunal cognitive examination, Proof of Value consensus, Laws-of-Form eigenform verification, and tau-normalized agent coordination -- are retained and further hardened. All code is open-source at https://github.com/Agnuxo1/p2pclaw-mcp-server.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

Internal defect detection constitutes a critical process in ensuring component quality, for which anomaly detection serves as an effective solution. However, existing anomaly detection datasets predominantly focus on surface defects in visible-light images, lacking publicly available X-ray datasets targeting internal defects in components. To address this gap, we construct the first publicly accessible component X-ray anomaly detection (CXR-AD) dataset, comprising real-world X-ray images. The dataset covers five industrial component categories, including 653 normal samples and 561 defect samples with precise pixel-level mask annotations. We systematically analyze the dataset characteristics and identify three major technical challenges: (1) strong coupling between complex internal structures and defect regions, (2) inherent low contrast and high noise interference in X-ray imaging, and (3) significant variations in defect scales and morphologies. To evaluate dataset complexity, we benchmark three state-of-the-art anomaly detection frameworks (feature-based, reconstruction-based, and zero-shot learning methods). Experimental results demonstrate a 29.78% average performance degradation on CXR-AD compared to MVTec AD, highlighting the limitations of current algorithms in handling internal defect detection tasks. To the best of our knowledge, CXR-AD represents the first publicly available X-ray dataset for component anomaly detection, providing a real-world industrial benchmark to advance algorithm development and enhance precision in internal defect inspection technologies.

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

Recent advancements in quality control across various industries have increasingly utilized the integration of video cameras and image processing for effective defect detection. A critical barrier to progress is the scarcity of comprehensive datasets featuring annotated defects, which are essential for developing and refining automated defect detection models. This systematic review, spanning from 2015 to 2023, identifies 15 publicly available datasets and critically examines them to assess their effectiveness and applicability for benchmarking and model development. Our findings reveal a diverse landscape of datasets, such as NEU-CLS, NEU-DET, DAGM, KolektorSDD, PCB Defect Dataset, and the Hollow Cylindrical Defect Detection Dataset, each with unique strengths and limitations in terms of image quality, defect type representation, and real-world applicability. The goal of this systematic review is to consolidate these datasets in a single location, providing researchers who seek such publicly available resources with a comprehensive reference.

We aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a two-stage framework for building anomaly detectors using normal training data only. We first learn self-supervised deep representations and then build a generative one-class classifier on learned representations. We learn representations by classifying normal data from the CutPaste, a simple data augmentation strategy that cuts an image patch and pastes at a random location of a large image. Our empirical study on MVTec anomaly detection dataset demonstrates the proposed algorithm is general to be able to detect various types of real-world defects. We bring the improvement upon previous arts by 3.1 AUCs when learning representations from scratch. By transfer learning on pretrained representations on ImageNet, we achieve a new state-of-theart 96.6 AUC. Lastly, we extend the framework to learn and extract representations from patches to allow localizing defective areas without annotations during training.

In recent years, performance on existing anomaly detection benchmarks like MVTec AD and VisA has started to saturate in terms of segmentation AU-PRO, with state-of-the-art models often competing in the range of less than one percentage point. This lack of discriminatory power prevents a meaningful comparison of models and thus hinders progress of the field, especially when considering the inherent stochastic nature of machine learning results. We present MVTec AD 2, a collection of eight anomaly detection scenarios with more than 8000 high-resolution images. It comprises challenging and highly relevant industrial inspection use cases that have not been considered in previous datasets, including transparent and overlapping objects, dark-field and back light illumination, objects with high variance in the normal data, and extremely small defects. We provide comprehensive evaluations of state-of-the-art methods and show that their performance remains below 60% average AU-PRO. Additionally, our dataset provides test scenarios with lighting condition changes to assess the robustness of methods under real-world distribution shifts. We host a publicly accessible evaluation server that holds the pixel-precise ground truth of the test set (https://benchmark.mvtec.com/). All image data is available at https://www.mvtec.com/company/research/datasets/mvtec-ad-2.

As deep neural networks become adopted in high-stakes domains, it is crucial to be able to identify when inference inputs are Out-of-Distribution (OOD) so that users can be alerted of likely drops in performance and calibration despite high confidence. Among many others, existing methods use the following two scores to do so without training on any apriori OOD examples: a learned temperature and an energy score. In this paper we introduce Ablated Learned Temperature Energy (or "AbeT" for short), a method which combines these prior methods in novel ways with effective modifications. Due to these contributions, AbeT lowers the False Positive Rate at 95% True Positive Rate (FPR@95) by 35.39% in classification (averaged across all ID and OOD datasets measured) compared to state of the art without training networks in multiple stages or requiring hyperparameters or test-time backward passes. We additionally provide empirical insights as to how our model learns to distinguish between In-Distribution (ID) and OOD samples while only being explicitly trained on ID samples via exposure to misclassified ID examples at training time. Lastly, we show the efficacy of our method in identifying predicted bounding boxes and pixels corresponding to OOD objects in object detection and semantic segmentation, respectively - with an AUROC increase of 5.15% in object detection and both a decrease in FPR@95 of 41.48% and an increase in AUPRC of 34.20% on average in semantic segmentation compared to previous state of the art.

Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

In recent years, the deterioration of artificial materials used in structures has become a serious social issue, increasing the importance of inspections. Non-destructive testing is gaining increased demand due to its capability to inspect for defects and deterioration in structures while preserving their functionality. Among these, Laser Ultrasonic Visualization Testing (LUVT) stands out because it allows the visualization of ultrasonic propagation. This makes it visually straightforward to detect defects, thereby enhancing inspection efficiency. With the increasing number of the deterioration structures, challenges such as a shortage of inspectors and increased workload in non-destructive testing have become more apparent. Efforts to address these challenges include exploring automated inspection using machine learning. However, the lack of anomalous data with defects poses a barrier to improving the accuracy of automated inspection through machine learning. Therefore, in this study, we propose a method for automated LUVT inspection using an anomaly detection approach with a diffusion model that can be trained solely on negative examples (defect-free data). We experimentally confirmed that our proposed method improves defect detection and localization compared to general object detection algorithms used previously.

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production environment. Therefore, we present the Texture-AD benchmark based on representative texture-based anomaly detection to evaluate the effectiveness of unsupervised anomaly detection algorithms in real-world applications. This dataset includes images of 15 different cloth, 14 semiconductor wafers and 10 metal plates acquired under different optical schemes. In addition, it includes more than 10 different types of defects produced during real manufacturing processes, such as scratches, wrinkles, color variations and point defects, which are often more difficult to detect than existing datasets. All anomalous areas are provided with pixel-level annotations to facilitate comprehensive evaluation using anomaly detection models. Specifically, to adapt to diverse products in automated pipelines, we present a new evaluation method and results of baseline algorithms. The experimental results show that Texture-AD is a difficult challenge for state-of-the-art algorithms. To our knowledge, Texture-AD is the first dataset to be devoted to evaluating industrial defect detection algorithms in the real world. The dataset is available at https://XXX.

We study whether demonstration-curation metrics that detect defective training episodes also improve the downstream behavior-cloning policy that trains on the curated data. On a contact-rich LIBERO pick-and-place benchmark with a controlled structural defect (early gripper release during the carry phase), we find that the two quantities are sharply decoupled. The metric with the highest defect-detection AUROC (0.804) produces the worst curated policy (13.3% task success), while a metric with a substantially lower AUROC (0.638) produces a policy that nearly matches the oracle trained on ground-truth clean data (90.0% vs. 93.3%). We further show that five of the seven metrics we evaluate exploit episode length as a trivial proxy for the defect label, a confound that inflates reported AUROCs to near-perfect values and disappears once episode length is controlled. Across all conditions, the contaminated baseline succeeds on only 3.3% of rollouts, and the two best curation methods close this to within 3 percentage points of the 93.3% oracle ceiling. Our results argue that curation methods should be evaluated by the policy they produce, not the defects they flag, and that any curation benchmark must control for episode length before reporting detection accuracy. We release the testbed, all metric implementations, and the evaluation pipeline.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement in wafer foundry. During manufacturing, various defects may appear standalone in the wafer or may appear as different combinations. Identifying multiple defects in a wafer is generally harder compared to identifying a single defect. Recently, deep learning methods have gained significant traction in mixed-type DPR. However, the complexity of defects requires complex and large models making them very difficult to operate on low-memory embedded devices typically used in fabrication labs. Another common issue is the unavailability of labeled data to train complex networks. In this work, we propose an unsupervised training routine to distill the knowledge of complex pre-trained models to lightweight deployment-ready models. We empirically show that this type of training compresses the model without sacrificing accuracy despite being up to 10 times smaller than the teacher model. The compressed model also manages to outperform contemporary state-of-the-art models.

Anomaly detection aims at detecting unexpected behaviours in the data. Because anomaly detection is usually an unsupervised task, traditional anomaly detectors learn a decision boundary by employing heuristics based on intuitions, which are hard to verify in practice. This introduces some uncertainty, especially close to the decision boundary, that may reduce the user trust in the detector's predictions. A way to combat this is by allowing the detector to reject examples with high uncertainty (Learning to Reject). This requires employing a confidence metric that captures the distance to the decision boundary and setting a rejection threshold to reject low-confidence predictions. However, selecting a proper metric and setting the rejection threshold without labels are challenging tasks. In this paper, we solve these challenges by setting a constant rejection threshold on the stability metric computed by ExCeeD. Our insight relies on a theoretical analysis of such a metric. Moreover, setting a constant threshold results in strong guarantees: we estimate the test rejection rate, and derive a theoretical upper bound for both the rejection rate and the expected prediction cost. Experimentally, we show that our method outperforms some metric-based methods.

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the effectiveness of ML in wafer defect identification, there is a noticeable absence of comprehensive reviews on this subject. This survey attempts to fill this void by amalgamating available literature and providing an in-depth analysis of the advantages, limitations, and potential applications of various ML classification algorithms in the realm of wafer defect detection. An innovative taxonomy of methodologies that we present provides a detailed classification of algorithms into more refined categories and techniques. This taxonomy follows a three-tier structure, starting from broad methodology categories and ending with specific techniques. It aids researchers in comprehending the complex relationships between different algorithms and their techniques. We employ a rigorous empirical and experimental evaluation to rank these varying techniques. For the empirical evaluation, we assess techniques based on a set of five criteria. The experimental evaluation ranks the algorithms employing the same techniques, sub-categories, and categories. Also the paper illuminates the future prospects of ML classification techniques for wafer defect identification, underscoring potential advancements and opportunities for further research in this field

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

Accurate defect segmentation is critical for industrial inspection, yet dense pixel-level annotations are rarely available. A common workaround is to convert inexpensive bounding boxes into pseudo-masks using foundation segmentation models such as the Segment Anything Model (SAM). However, these pseudo-labels are systematically noisy on industrial surfaces, often hallucinating background structure while missing sparse defects. To address this limitation, a noise-robust box-to-pixel distillation framework, Boxes2Pixels, is proposed that treats SAM as a noisy teacher rather than a source of ground-truth supervision. Bounding boxes are converted into pseudo-masks offline by SAM, and a compact student is trained with (i) a hierarchical decoder over frozen DINOv2 features for semantic stability, (ii) an auxiliary binary localization head to decouple sparse foreground discovery from class prediction, and (iii) a one-sided online self-correction mechanism that relaxes background supervision when the student is confident, targeting teacher false negatives. On a manually annotated wind turbine inspection benchmark, the proposed Boxes2Pixels improves anomaly mIoU by +6.97 and binary IoU by +9.71 over the strongest baseline trained under identical weak supervision. Moreover, online self-correction increases the binary recall by +18.56, while the model employs 80\% fewer trainable parameters. Code is available at https://github.com/CLendering/Boxes2Pixels.

In the field of integrated circuit manufacturing, the detection and classification of nanoscale wafer defects are critical for subsequent root cause analysis and yield enhancement. The complex background patterns observed in scanning electron microscope (SEM) images and the diverse textures of the defects pose significant challenges. Traditional methods usually suffer from insufficient data, labels, and poor transferability. In this paper, we propose a novel few-shot learning approach, SEM-CLIP, for accurate defect classification and segmentation. SEM-CLIP customizes the Contrastive Language-Image Pretraining (CLIP) model to better focus on defect areas and minimize background distractions, thereby enhancing segmentation accuracy. We employ text prompts enriched with domain knowledge as prior information to assist in precise analysis. Additionally, our approach incorporates feature engineering with textual guidance to categorize defects more effectively. SEM-CLIP requires little annotated data, substantially reducing labor demands in the semiconductor industry. Extensive experimental validation demonstrates that our model achieves impressive classification and segmentation results under few-shot learning scenarios.

In this work we explore the application of AI to robotic welding. Robotic welding is a widely used technology in many industries, but robots currently do not have the capability to detect welding defects which get introduced due to various reasons in the welding process. We describe how deep-learning methods can be applied to detect weld defects in real-time by recording the welding process with microphones and a camera. Our findings are based on a large database with more than 4000 welding samples we collected which covers different weld types, materials and various defect categories. All deep learning models are trained in an unsupervised fashion because the space of possible defects is large and the defects in our data may contain biases. We demonstrate that a reliable real-time detection of most categories of weld defects is feasible both from audio and video, with improvements achieved by combining both modalities. Specifically, the multi-modal approach achieves an average Area-under-ROC-Curve (AUC) of 0.92 over all eleven defect types in our data. We conclude the paper with an analysis of the results by defect type and a discussion of future work.

Industrial defect detection systems face critical limitations when confined to one-class anomaly detection paradigms, which assume uniform outlier distributions and struggle with data scarcity in realworld manufacturing environments. We present ExDD (Explicit Dual Distribution), a novel framework that transcends these limitations by explicitly modeling dual feature distributions. Our approach leverages parallel memory banks that capture the distinct statistical properties of both normality and anomalous patterns, addressing the fundamental flaw of uniform outlier assumptions. To overcome data scarcity, we employ latent diffusion models with domain-specific textual conditioning, generating in-distribution synthetic defects that preserve industrial context. Our neighborhood-aware ratio scoring mechanism elegantly fuses complementary distance metrics, amplifying signals in regions exhibiting both deviation from normality and similarity to known defect patterns. Experimental validation on KSDD2 demonstrates superior performance (94.2% I-AUROC, 97.7% P-AUROC), with optimal augmentation at 100 synthetic samples.

We present the Open Stamped Parts Dataset (OSPD), featuring synthetic and real images of stamped metal sheets for auto manufacturing. The real part images, captured from 7 cameras, consist of 7,980 unlabeled images and 1,680 labeled images. In addition, we have compiled a defect dataset by overlaying synthetically generated masks on 10\% of the holes. The synthetic dataset replicates the real manufacturing environment in terms of lighting and part placement relative to the cameras. The synthetic data includes 7,980 training images, 1,680 validation images and 1,680 test images, each with bounding box and segmentation mask annotations around all holes. 10\% of the holes in the synthetic data mimic defects generated in the real image dataset. We trained a hole-detection model on the synthetic-OSPD, achieving a modified recall score of 67.2\% and a precision of 94.4\% . We anticipate researchers in auto manufacturing use OSPD to advance the state of the art in defect detection of stamped holes in the metal-sheet stamping process. The dataset is available for download at: https://tinyurl.com/hm6xatd7.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Anomaly detection is nowadays increasingly used in industrial applications and processes. One of the main fields of the appliance is the visual inspection for surface anomaly detection, which aims to spot regions that deviate from regularity and consequently identify abnormal products. Defect localization is a key task, that usually is achieved using a basic comparison between generated image and the original one, implementing some blob-analysis or image-editing algorithms, in the post-processing step, which is very biased towards the source dataset, and they are unable to generalize. Furthermore, in industrial applications, the totality of the image is not always interesting but could be one or some regions of interest (ROIs), where only in those areas there are relevant anomalies to be spotted. For these reasons, we propose a new architecture composed by two blocks. The first block is a Generative Adversarial Network (GAN), based on a residual autoencoder (ResAE), to perform reconstruction and denoising processes, while the second block produces image segmentation, spotting defects. This method learns from a dataset composed of good products and generated synthetic defects. The discriminative network is trained using a ROI for each image contained in the training dataset. The network will learn in which area anomalies are relevant. This approach guarantees the reduction of using pre-processing algorithms, formerly developed with blob-analysis and image-editing procedures. To test our model we used challenging MVTec anomaly detection datasets and an industrial large dataset of pharmaceutical BFS strips of vials. This set constitutes a more realistic use case of the aforementioned network.

In this paper, we introduce a new benchmark for continual learning in anomaly detection, aimed at better reflecting real-world deployment scenarios. Our benchmark, Continual-MEGA, includes a large and diverse dataset that significantly expands existing evaluation settings by combining carefully curated existing datasets with our newly proposed dataset, ContinualAD. In addition to standard continual learning with expanded quantity, we propose a novel scenario that measures zero-shot generalization to unseen classes, those not observed during continual adaptation. This setting poses a new problem setting that continual adaptation also enhances zero-shot performance. We also present a unified baseline algorithm that improves robustness in few-shot detection and maintains strong generalization. Through extensive evaluations, we report three key findings: (1) existing methods show substantial room for improvement, particularly in pixel-level defect localization; (2) our proposed method consistently outperforms prior approaches; and (3) the newly introduced ContinualAD dataset enhances the performance of strong anomaly detection models. We release the benchmark and code in https://github.com/Continual-Mega/Continual-Mega.

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect inspection software exists. Machine Learning-based SEM image analysis has become an increasingly popular research topic for defect inspection with supervised ML models often showing the best performance. However, little research has been done on obtaining a dataset with high-quality labels for these supervised models. In this work, we propose a method for obtaining coherent and complete labels for a dataset of hexagonal contact hole DSA patterns while requiring minimal quality control effort from a DSA expert. We show that YOLOv8, a state-of-the-art neural network, achieves defect detection precisions of more than 0.9 mAP on our final dataset which best reflects DSA expert defect labeling expectations. We discuss the strengths and limitations of our proposed labeling approach and suggest directions for future work in data-centric ML-based defect inspection.

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the scarcity of data, as the production of real semiconductor wafer data for training these models involves high financial and time costs. Moreover, the existing simulation methods fall short of replicating images with identical noise characteristics, surface roughness and stochastic variations at advanced nodes. We propose a method for generating synthetic semiconductor SEM images using a diffusion model within a limited data regime. In contrast to images generated through conventional simulation methods, SEM images generated through our proposed DL method closely resemble real SEM images, replicating their noise characteristics and surface roughness adaptively. Our main contributions, which are validated on three different real semiconductor datasets, are: i) proposing a patch-based generative framework utilizing DDPM to create SEM images with intended defect classes, addressing challenges related to class-imbalance and data insufficiency, ii) demonstrating generated synthetic images closely resemble real SEM images acquired from the tool, preserving all imaging conditions and metrology characteristics without any metadata supervision, iii) demonstrating a defect detector trained on generated defect dataset, either independently or combined with a limited real dataset, can achieve similar or improved performance on real wafer SEM images during validation/testing compared to exclusive training on a real defect dataset, iv) demonstrating the ability of the proposed approach to transfer defect types, critical dimensions, and imaging conditions from one specified CD/Pitch and metrology specifications to another, thereby highlighting its versatility.

Anomaly detection in industrial visual inspection is challenging due to the scarcity of defective samples. Most existing methods rely on unsupervised reconstruction using only normal data, often resulting in overfitting and poor detection of subtle defects. We propose a semi-supervised deep reinforcement learning framework that integrates a neural batch sampler, an autoencoder, and a predictor. The RL-based sampler adaptively selects informative patches by balancing exploration and exploitation through a composite reward. The autoencoder generates loss profiles highlighting abnormal regions, while the predictor performs segmentation in the loss-profile space. This interaction enables the system to effectively learn both normal and defective patterns with limited labeled data. Experiments on the MVTec AD dataset demonstrate that our method achieves higher accuracy and better localization of subtle anomalies than recent state-of-the-art approaches while maintaining low complexity, yielding an average improvement of 0.15 in F1_max and 0.06 in AUC, with a maximum gain of 0.37 in F1_max in the best case.

To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., 224x224 pixels, obtained by downsampling the original input images. However, while numerous industrial applications demand the identification of both large and small defects, downsampling the input image to a low resolution may hinder a method's ability to pinpoint tiny anomalies. We propose a novel Teacher--Student paradigm to leverage strong pre-trained features while processing high-resolution input images very efficiently. The core idea concerns training two shallow MLPs (the Students) by nominal images so as to mimic the mappings between the patch embeddings induced by the self-attention layers of a frozen vision Transformer (the Teacher). Indeed, learning these mappings sets forth a challenging pretext task that small-capacity models are unlikely to accomplish on out-of-distribution data such as anomalous images. Our method can spot anomalies from high-resolution images and runs way faster than competitors, achieving state-of-the-art performance on MVTec AD and the best segmentation results on VisA. We also propose novel evaluation metrics to capture robustness to defect size, i.e., the ability to preserve good localisation from large anomalies to tiny ones. Evaluating our method also by these metrics reveals its neatly superior performance.

Industrial anomaly detection (IAD) has garnered significant attention and experienced rapid development. However, the recent development of IAD approach has encountered certain difficulties due to dataset limitations. On the one hand, most of the state-of-the-art methods have achieved saturation (over 99% in AUROC) on mainstream datasets such as MVTec, and the differences of methods cannot be well distinguished, leading to a significant gap between public datasets and actual application scenarios. On the other hand, the research on various new practical anomaly detection settings is limited by the scale of the dataset, posing a risk of overfitting in evaluation results. Therefore, we propose a large-scale, Real-world, and multi-view Industrial Anomaly Detection dataset, named Real-IAD, which contains 150K high-resolution images of 30 different objects, an order of magnitude larger than existing datasets. It has a larger range of defect area and ratio proportions, making it more challenging than previous datasets. To make the dataset closer to real application scenarios, we adopted a multi-view shooting method and proposed sample-level evaluation metrics. In addition, beyond the general unsupervised anomaly detection setting, we propose a new setting for Fully Unsupervised Industrial Anomaly Detection (FUIAD) based on the observation that the yield rate in industrial production is usually greater than 60%, which has more practical application value. Finally, we report the results of popular IAD methods on the Real-IAD dataset, providing a highly challenging benchmark to promote the development of the IAD field.

Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity about some hyper-parameters. In this work, we design a deep model that accurately detects PCB defects from an input pair of a detect-free template and a defective tested image. A novel group pyramid pooling module is proposed to efficiently extract features of a large range of resolutions, which are merged by group to predict PCB defect of corresponding scales. To train the deep model, a dataset is established, namely DeepPCB, which contains 1,500 image pairs with annotations including positions of 6 common types of PCB defects. Experiment results validate the effectiveness and efficiency of the proposed model by achieving 98.6% mAP @ 62 FPS on DeepPCB dataset. This dataset is now available at: https://github.com/tangsanli5201/DeepPCB.

We present IMDD-1M, the first large-scale Industrial Multimodal Defect Dataset comprising 1,000,000 aligned image-text pairs, designed to advance multimodal learning for manufacturing and quality inspection. IMDD-1M contains high-resolution real-world defects spanning over 60 material categories and more than 400 defect types, each accompanied by expert-verified annotations and fine-grained textual descriptions detailing defect location, severity, and contextual attributes. This dataset enables a wide spectrum of applications, including classification, segmentation, retrieval, captioning, and generative modeling. Building upon IMDD-1M, we train a diffusion-based vision-language foundation model from scratch, specifically tailored for industrial scenarios. The model serves as a generalizable foundation that can be efficiently adapted to specialized domains through lightweight fine-tuning. With less than 5% of the task-specific data required by dedicated expert models, it achieves comparable performance, highlighting the potential of data-efficient foundation model adaptation for industrial inspection and generation, paving the way for scalable, domain-adaptive, and knowledge-grounded manufacturing intelligence.

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to identify the defects. These methods are generally very huge and have significant inference time. They also require GPU support to efficiently operate. All these issues make these models not fit for on-line prediction in the manufacturing foundry. In this paper, we propose an extremely simple yet effective technique to extract features from wafer images. The proposed method is extremely fast, intuitive, and non-parametric while being explainable. The experiment results show that the proposed pipeline outperforms conventional deep learning models. Our feature extraction requires no training or fine-tuning while preserving the relative shape and location of data points as revealed by our interpretability analysis.

Despite progress in vision-based inspection algorithms, real-world industrial challenges -- specifically in data availability, quality, and complex production requirements -- often remain under-addressed. We introduce the VISION Datasets, a diverse collection of 14 industrial inspection datasets, uniquely poised to meet these challenges. Unlike previous datasets, VISION brings versatility to defect detection, offering annotation masks across all splits and catering to various detection methodologies. Our datasets also feature instance-segmentation annotation, enabling precise defect identification. With a total of 18k images encompassing 44 defect types, VISION strives to mirror a wide range of real-world production scenarios. By supporting two ongoing challenge competitions on the VISION Datasets, we hope to foster further advancements in vision-based industrial inspection.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is much more complicated compared to single-type DPR due to varied spatial features, the uncertainty of defects, and the number of defects present. To accurately predict the number of defects as well as the types of defects, we propose a novel compact deformable convolutional transformer (DC Transformer). Specifically, DC Transformer focuses on the global features present in the wafer map by virtue of learnable deformable kernels and multi-head attention to the global features. The proposed method succinctly models the internal relationship between the wafer maps and the defects. DC Transformer is evaluated on a real dataset containing 38 defect patterns. Experimental results show that DC Transformer performs exceptionally well in recognizing both single and mixed-type defects. The proposed method outperforms the current state of the models by a considerable margin

There can be numerous electronic components on a given PCB, making the task of visual inspection to detect defects very time-consuming and prone to error, especially at scale. There has thus been significant interest in automatic PCB component detection, particularly leveraging deep learning. However, deep neural networks typically require high computational resources, possibly limiting their feasibility in real-world use cases in manufacturing, which often involve high-volume and high-throughput detection with constrained edge computing resource availability. As a result of an exploration of efficient deep neural network architectures for this use case, we introduce PCBDet, an attention condenser network design that provides state-of-the-art inference throughput while achieving superior PCB component detection performance compared to other state-of-the-art efficient architecture designs. Experimental results show that PCBDet can achieve up to 2times inference speed-up on an ARM Cortex A72 processor when compared to an EfficientNet-based design while achieving sim2-4\% higher mAP on the FICS-PCB benchmark dataset.

Industrial visual inspection in pharmaceutical production requires high accuracy under strict constraints on cycle time, hardware footprint, and operational cost. Manual inline inspection is still common, but it is affected by operator variability and limited throughput. Classical rule-based computer vision pipelines are often rigid and difficult to scale to highly variable production scenarios. To address these limitations, we present a semi-supervised anomaly detection framework based on a generative adversarial architecture with a residual autoencoder and a dense bottleneck, specifically designed for online deployment on a high-speed Blow-Fill-Seal (BFS) line. The model is trained only on nominal samples and detects anomalies through reconstruction residuals, providing both classification and spatial localization via heatmaps. The training set contains 2,815,200 grayscale patches. Experiments on a real industrial test kit show high detection performance while satisfying timing constraints compatible with a 500 ms acquisition slot.

Surface defects are a primary source of yield loss in manufacturing, yet existing anomaly detection methods often fail in real-world deployment due to limited and unrepresentative datasets. To overcome this, we introduce 3D-ADAM, a 3D Anomaly Detection in Additive Manufacturing dataset, that is the first large-scale, industry-relevant dataset for RGB+3D surface defect detection in additive manufacturing. 3D-ADAM comprises 14,120 high-resolution scans of 217 unique parts, captured with four industrial depth sensors, and includes 27,346 annotated defects across 12 categories along with 27,346 annotations of machine element features in 16 classes. 3D-ADAM is captured in a real industrial environment and as such reflects real production conditions, including variations in part placement, sensor positioning, lighting, and partial occlusion. Benchmarking state-of-the-art models demonstrates that 3D-ADAM presents substantial challenges beyond existing datasets. Validation through expert labelling surveys with industry partners further confirms its industrial relevance. By providing this benchmark, 3D-ADAM establishes a foundation for advancing robust 3D anomaly detection capable of meeting manufacturing demands.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Semiconductor lasers have been rapidly evolving to meet the demands of next-generation optical networks. This imposes much more stringent requirements on the laser reliability, which are dominated by degradation mechanisms (e.g., sudden degradation) limiting the semiconductor laser lifetime. Physics-based approaches are often used to characterize the degradation behavior analytically, yet explicit domain knowledge and accurate mathematical models are required. Building such models can be very challenging due to a lack of a full understanding of the complex physical processes inducing the degradation under various operating conditions. To overcome the aforementioned limitations, we propose a new data-driven approach, extracting useful insights from the operational monitored data to predict the degradation trend without requiring any specific knowledge or using any physical model. The proposed approach is based on an unsupervised technique, a conditional variational autoencoder, and validated using vertical-cavity surface-emitting laser (VCSEL) and tunable edge emitting laser reliability data. The experimental results confirm that our model (i) achieves a good degradation prediction and generalization performance by yielding an F1 score of 95.3%, (ii) outperforms several baseline ML based anomaly detection techniques, and (iii) helps to shorten the aging tests by early predicting the failed devices before the end of the test and thereby saving costs

The proliferation of large language models has raised growing concerns about their misuse, particularly in cases where AI-generated text is falsely attributed to human authors. Machine-generated content detectors claim to effectively identify such text under various conditions and from any language model. This paper critically evaluates these claims by assessing several popular detectors (RADAR, Wild, T5Sentinel, Fast-DetectGPT, PHD, LogRank, Binoculars) on a range of domains, datasets, and models that these detectors have not previously encountered. We employ various prompting strategies to simulate practical adversarial attacks, demonstrating that even moderate efforts can significantly evade detection. We emphasize the importance of the true positive rate at a specific false positive rate (TPR@FPR) metric and demonstrate that these detectors perform poorly in certain settings, with TPR@.01 as low as 0%. Our findings suggest that both trained and zero-shot detectors struggle to maintain high sensitivity while achieving a reasonable true positive rate.

Deep Neural Networks achieve high performance in vision tasks by learning features from regions of interest (ROI) within images, but their performance degrades when deployed on out-of-distribution (OOD) data that differs from training data. This challenge has led to OOD detection methods that aim to identify and reject unreliable predictions. Although prior work shows that OOD detection performance varies by artefact type, the underlying causes remain underexplored. To this end, we identify a previously unreported bias in OOD detection: for hard-to-detect artefacts (near-OOD), detection performance typically improves when the artefact shares visual similarity (e.g. colour) with the model's ROI and drops when it does not - a phenomenon we term the Invisible Gorilla Effect. For example, in a skin lesion classifier with red lesion ROI, we show the method Mahalanobis Score achieves a 31.5% higher AUROC when detecting OOD red ink (similar to ROI) compared to black ink (dissimilar) annotations. We annotated artefacts by colour in 11,355 images from three public datasets (e.g. ISIC) and generated colour-swapped counterfactuals to rule out dataset bias. We then evaluated 40 OOD methods across 7 benchmarks and found significant performance drops for most methods when artefacts differed from the ROI. Our findings highlight an overlooked failure mode in OOD detection and provide guidance for more robust detectors. Code and annotations are available at: https://github.com/HarryAnthony/Invisible_Gorilla_Effect.

Visual anomaly detection aims to identify anomalous regions in images through unsupervised learning paradigms, with increasing application demand and value in fields such as industrial inspection and medical lesion detection. Despite significant progress in recent years, there is a lack of comprehensive benchmarks to adequately evaluate the performance of various mainstream methods across different datasets under the practical multi-class setting. The absence of standardized experimental setups can lead to potential biases in training epochs, resolution, and metric results, resulting in erroneous conclusions. This paper addresses this issue by proposing a comprehensive visual anomaly detection benchmark, ADer, which is a modular framework that is highly extensible for new methods. The benchmark includes multiple datasets from industrial and medical domains, implementing fifteen state-of-the-art methods and nine comprehensive metrics. Additionally, we have proposed the GPU-assisted ADEval package to address the slow evaluation problem of metrics like time-consuming mAU-PRO on large-scale data, significantly reducing evaluation time by more than 1000-fold. Through extensive experimental results, we objectively reveal the strengths and weaknesses of different methods and provide insights into the challenges and future directions of multi-class visual anomaly detection. We hope that ADer will become a valuable resource for researchers and practitioners in the field, promoting the development of more robust and generalizable anomaly detection systems. Full codes are open-sourced at https://github.com/zhangzjn/ader.

Writing good software tests can be challenging, therefore approaches that support developers are desirable. While generating complete tests automatically is such an approach commonly proposed in research, developers may already have specific test scenarios in mind and thus just require help in selecting the most suitable test assertions for these scenarios. This can be done using deep learning models to predict assertions for given test code. Prior research on assertion generation trained these models specifically for the task, raising the question how much the use of larger models pre-trained on code that have emerged since then can improve their performance. In particular, while abstracting identifiers has been shown to improve specifically trained models, it remains unclear whether this also generalises to models pre-trained on non-abstracted code. Finally, even though prior work demonstrated high accuracy it remains unclear how this translates into the effectiveness of the assertions at their intended application -- finding faults. To shed light on these open questions, in this paper we propose AsserT5, a new model based on the pre-trained CodeT5 model, and use this to empirically study assertion generation. We find that the abstraction and the inclusion of the focal method are useful also for a fine-tuned pre-trained model, resulting in test assertions that match the ground truth assertions precisely in up to 59.5\% of cases, more than twice as precise as prior models. However, evaluation on real bugs from the Defects4J dataset shows that out of 138 bugs detectable with assertions in real-world projects, AsserT5 was only able to suggest fault-finding assertions for 33, indicating the need for further improvements.

In the past couple of decades, significant research efforts are devoted to the prediction of software bugs. However, most existing work in this domain treats all bugs the same, which is not the case in practice. It is important for a defect prediction method to estimate the severity of the identified bugs so that the higher-severity ones get immediate attention. In this study, we investigate source code metrics, source code representation using large language models (LLMs), and their combination in predicting bug severity labels of two prominent datasets. We leverage several source metrics at method-level granularity to train eight different machine-learning models. Our results suggest that Decision Tree and Random Forest models outperform other models regarding our several evaluation metrics. We then use the pre-trained CodeBERT LLM to study the source code representations' effectiveness in predicting bug severity. CodeBERT finetuning improves the bug severity prediction results significantly in the range of 29%-140% for several evaluation metrics, compared to the best classic prediction model on source code metric. Finally, we integrate source code metrics into CodeBERT as an additional input, using our two proposed architectures, which both enhance the CodeBERT model effectiveness.

Visual anomaly detection is critical in industrial manufacturing, but traditional methods often rely on extensive normal datasets and custom models, limiting scalability. Recent advancements in large-scale visual-language models have significantly improved zero/few-shot anomaly detection. However, these approaches may not fully utilize hierarchical features, potentially missing nuanced details. We introduce a window self-attention mechanism based on the CLIP model, combined with learnable prompts to process multi-level features within a Soldier-Offier Window self-Attention (SOWA) framework. Our method has been tested on five benchmark datasets, demonstrating superior performance by leading in 18 out of 20 metrics compared to existing state-of-the-art techniques.

Automated detection of defects in Printed Circuit Board (PCB) manufacturing using Solder Paste Inspection (SPI) and Automated Optical Inspection (AOI) machines can help improve operational efficiency and significantly reduce the need for manual intervention. In this paper, using SPI-extracted features of 6 million pins, we demonstrate a data-centric approach to train Machine Learning (ML) models to detect PCB defects at three stages of PCB manufacturing. The 6 million PCB pins correspond to 2 million components that belong to 15,387 PCBs. Using a base extreme gradient boosting (XGBoost) ML model, we iterate on the data pre-processing step to improve detection performance. Combining pin-level SPI features using component and PCB IDs, we developed training instances also at the component and PCB level. This allows the ML model to capture any inter-pin, inter-component, or spatial effects that may not be apparent at the pin level. Models are trained at the pin, component, and PCB levels, and the detection results from the different models are combined to identify defective components.

Industrial quality inspection plays a critical role in modern manufacturing by identifying defective products during production. While single-modality approaches using either 3D point clouds or 2D RGB images suffer from information incompleteness, multimodal anomaly detection offers promise through the complementary fusion of crossmodal data. However, existing methods face challenges in effectively integrating unimodal results and improving discriminative power. To address these limitations, we first reinterpret memory bank-based anomaly scores in single modalities as isotropic Euclidean distances in local feature spaces. Dynamically evolving from Euclidean metrics, we propose a novel Geometry-Guided Score Fusion (G^{2}SF) framework that progressively learns an anisotropic local distance metric as a unified score for the fusion task. Through a geometric encoding operator, a novel Local Scale Prediction Network (LSPN) is proposed to predict direction-aware scaling factors that characterize first-order local feature distributions, thereby enhancing discrimination between normal and anomalous patterns. Additionally, we develop specialized loss functions and score aggregation strategy from geometric priors to ensure both metric generalization and efficacy. Comprehensive evaluations on the MVTec-3D AD and Eyecandies datasets demonstrate the state-of-the-art detection performance of our method, and detailed ablation analysis validates each component's contribution. Our code is available at https://github.com/ctaoaa/G2SF.

Unsupervised anomaly in industry has been a concerning topic and a stepping stone for high performance industrial automation process. The vast majority of industry-oriented methods focus on learning from good samples to detect anomaly notwithstanding some specific industrial scenario requiring even less specific training and therefore a generalization for anomaly detection. The obvious use case is the fabric anomaly detection, where we have to deal with a really wide range of colors and types of textile and a stoppage of the production line for training could not be considered. In this paper, we propose an automation process for industrial fabric texture defect detection with a specificity-learning process during the domain-generalized anomaly detection. Combining the ability to generalize and the learning process offer a fast and precise anomaly detection and segmentation. The main contributions of this paper are the following: A domain-generalization texture anomaly detection method achieving the state-of-the-art performances, a fast specific training on good samples extracted by the proposed method, a self-evaluation method based on custom defect creation and an automatic detection of already seen fabric to prevent re-training.

The use of modern Natural Language Processing (NLP) techniques has shown to be beneficial for software engineering tasks, such as vulnerability detection and type inference. However, training deep NLP models requires significant computational resources. This paper explores techniques that aim at achieving the best usage of resources and available information in these models. We propose a generic approach, EarlyBIRD, to build composite representations of code from the early layers of a pre-trained transformer model. We empirically investigate the viability of this approach on the CodeBERT model by comparing the performance of 12 strategies for creating composite representations with the standard practice of only using the last encoder layer. Our evaluation on four datasets shows that several early layer combinations yield better performance on defect detection, and some combinations improve multi-class classification. More specifically, we obtain a +2 average improvement of detection accuracy on Devign with only 3 out of 12 layers of CodeBERT and a 3.3x speed-up of fine-tuning. These findings show that early layers can be used to obtain better results using the same resources, as well as to reduce resource usage during fine-tuning and inference.

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet industrial demands for high performance, efficiency, and adaptability. Existing approaches are often constrained to specific supervision scenarios and struggle to adapt to the diverse data annotations encountered in real-world manufacturing processes, such as unsupervised, weakly supervised, mixed supervision, and fully supervised settings. To address these challenges, we propose SuperSimpleNet, a highly efficient and adaptable discriminative model built on the foundation of SimpleNet. SuperSimpleNet incorporates a novel synthetic anomaly generation process, an enhanced classification head, and an improved learning procedure, enabling efficient training in all four supervision scenarios, making it the first model capable of fully leveraging all available data annotations. SuperSimpleNet sets a new standard for performance across all scenarios, as demonstrated by its results on four challenging benchmark datasets. Beyond accuracy, it is very fast, achieving an inference time below 10 ms. With its ability to unify diverse supervision paradigms while maintaining outstanding speed and reliability, SuperSimpleNet represents a promising step forward in addressing real-world manufacturing challenges and bridging the gap between academic research and industrial applications. Code: https://github.com/blaz-r/SuperSimpleNet

The deployment of automated pavement defect detection is often hindered by poor cross-domain generalization. Supervised detectors achieve strong in-domain accuracy but require costly re-annotation for new environments, while standard self-supervised methods capture generic features and remain vulnerable to domain shift. We propose \ours, a self-supervised framework that visually probes target domains without labels. \ours introduces a Self-supervised Prompt Enhancement Module (SPEM), which derives defect-aware prompts from unlabeled target data to guide a frozen ViT backbone, and a Domain-Aware Prompt Alignment (DAPA) objective, which aligns prompt-conditioned source and target representations. Experiments on four challenging benchmarks show that \ours consistently outperforms strong supervised, self-supervised, and adaptation baselines, achieving robust zero-shot transfer, improved resilience to domain variations, and high data efficiency in few-shot adaptation. These results highlight self-supervised prompting as a practical direction for building scalable and adaptive visual inspection systems. Source code is publicly available: https://github.com/xixiaouab/PROBE/tree/main

Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding. To address these challenges, we introduce a Large-Scale Multi-Modal Industrial Open-Closed benchmark (MMIOC-1M) containing over one million samples across 14 super-categories, 29 industrial scenes, and 351 defect subcategories. To our knowledge, MMIOC-1M is the first unified largest benchmark supporting both open-vocabulary and closed-set industrial detection, providing valuable pre-training data for LVLMs in industrial scenarios. Furthermore, we propose a Refined Text-Visual Prompt Network (RTVPNet) that incorporates three key innovations: (1) an expert-assisted domain projection mechanism that enables rapid adaptation of general vision models to industrial domains, (2) an energy-based sparse sampling strategy that automatically generates refined visual prompts without manual intervention, and (3) a bidirectional text-visual interaction module that enhances cross-modal semantic alignment and understanding. Extensive experiments demonstrate that RTVPNet achieves state-of-the-art performance on MMIOC-1M, LVIS, and COCO benchmarks while maintaining computational efficiency. The dataset and code are available at https://github.com/hellozzk/MMIO.

One persistent obstacle in industrial quality inspection is the detection of anomalies. In real-world use cases, two problems must be addressed: anomalous data is sparse and the same types of anomalies need to be detected on previously unseen objects. Current anomaly detection approaches can be trained with sparse nominal data, whereas domain generalization approaches enable detecting objects in previously unseen domains. Utilizing those two observations, we introduce the hybrid task of domain generalization on sparse classes. To introduce an accompanying dataset for this task, we present a modification of the well-established MVTec AD dataset by generating three new datasets. In addition to applying existing methods for benchmark, we design two embedding-based approaches, Spatial Embedding MLP (SEMLP) and Labeled PatchCore. Overall, SEMLP achieves the best performance with an average image-level AUROC of 87.2 % vs. 80.4 % by MIRO. The new and openly available datasets allow for further research to improve industrial anomaly detection.

This position paper argues that the machine learning community should prioritize early-stage quality assurance in annotation pipelines over the prevailing practice of late-stage validation. Data quality bottlenecks increasingly limit foundation model improvement, yet quality assurance research focuses almost exclusively on validation methods rather than validation timing. When validation occurs, not merely what methods are employed, fundamentally determines both error rates and annotation costs. This temporal neglect is puzzling given the well-established "shift-left" principle from software engineering, where empirical studies demonstrate 4--100x cost multipliers for defects detected in later stages (Boehm, 1981; Shull et al., 2002). Annotation pipelines exhibit analogous dynamics: errors caught before annotation begins cost a fraction of those discovered after review cycles complete. We propose a taxonomy of three QA trigger points, namely pre-annotation (T0), post-annotation (T1), and post-review (T2), that decompose annotation workflows into discrete validation opportunities. A parametric error-propagation model formalizes when timing affects final error rates versus only economics, making timing a measurable design variable rather than a configuration afterthought. A survey of 47 recent papers reveals that only 4% report when validation occurs, a striking gap given timing's demonstrated impact in adjacent fields. Without explicit attention to QA timing, the community risks optimizing validation methods while ignoring the structural variable that may matter most. Acting on this position requires three steps: researchers should report QA timing configurations alongside validation methods; annotation platforms should expose timing as a first-class parameter; and the community should run controlled experiments that measure stage-specific detection rates directly.

In this work, by re-examining the "matching" nature of Anomaly Detection (AD), we propose a new AD framework that simultaneously enjoys new records of AD accuracy and dramatically high running speed. In this framework, the anomaly detection problem is solved via a cascade patch retrieval procedure that retrieves the nearest neighbors for each test image patch in a coarse-to-fine fashion. Given a test sample, the top-K most similar training images are first selected based on a robust histogram matching process. Secondly, the nearest neighbor of each test patch is retrieved over the similar geometrical locations on those "global nearest neighbors", by using a carefully trained local metric. Finally, the anomaly score of each test image patch is calculated based on the distance to its "local nearest neighbor" and the "non-background" probability. The proposed method is termed "Cascade Patch Retrieval" (CPR) in this work. Different from the conventional patch-matching-based AD algorithms, CPR selects proper "targets" (reference images and locations) before "shooting" (patch-matching). On the well-acknowledged MVTec AD, BTAD and MVTec-3D AD datasets, the proposed algorithm consistently outperforms all the comparing SOTA methods by remarkable margins, measured by various AD metrics. Furthermore, CPR is extremely efficient. It runs at the speed of 113 FPS with the standard setting while its simplified version only requires less than 1 ms to process an image at the cost of a trivial accuracy drop. The code of CPR is available at https://github.com/flyinghu123/CPR.

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suf- fer from limitations in terms of the number of defect sam- ples, types of defects, and availability of real-world scenes. These constraints inhibit researchers from further exploring the performance of industrial detection with higher accuracy. To this end, we propose a new large-scale anomaly detection dataset called 3CAD, which is derived from real 3C produc- tion lines. Specifically, the proposed 3CAD includes eight different types of manufactured parts, totaling 27,039 high- resolution images labeled with pixel-level anomalies. The key features of 3CAD are that it covers anomalous regions of different sizes, multiple anomaly types, and the possibility of multiple anomalous regions and multiple anomaly types per anomaly image. This is the largest and first anomaly de- tection dataset dedicated to 3C product quality control for community exploration and development. Meanwhile, we in- troduce a simple yet effective framework for unsupervised anomaly detection: a Coarse-to-Fine detection paradigm with Recovery Guidance (CFRG). To detect small defect anoma- lies, the proposed CFRG utilizes a coarse-to-fine detection paradigm. Specifically, we utilize a heterogeneous distilla- tion model for coarse localization and then fine localiza- tion through a segmentation model. In addition, to better capture normal patterns, we introduce recovery features as guidance. Finally, we report the results of our CFRG frame- work and popular anomaly detection methods on the 3CAD dataset, demonstrating strong competitiveness and providing a highly challenging benchmark to promote the development of the anomaly detection field. Data and code are available: https://github.com/EnquanYang2022/3CAD.

Visual anomaly detection, an important problem in computer vision, is usually formulated as a one-class classification and segmentation task. The student-teacher (S-T) framework has proved to be effective in solving this challenge. However, previous works based on S-T only empirically applied constraints on normal data and fused multi-level information. In this study, we propose an improved model called DeSTSeg, which integrates a pre-trained teacher network, a denoising student encoder-decoder, and a segmentation network into one framework. First, to strengthen the constraints on anomalous data, we introduce a denoising procedure that allows the student network to learn more robust representations. From synthetically corrupted normal images, we train the student network to match the teacher network feature of the same images without corruption. Second, to fuse the multi-level S-T features adaptively, we train a segmentation network with rich supervision from synthetic anomaly masks, achieving a substantial performance improvement. Experiments on the industrial inspection benchmark dataset demonstrate that our method achieves state-of-the-art performance, 98.6% on image-level AUC, 75.8% on pixel-level average precision, and 76.4% on instance-level average precision.

Artificial Intelligence (AI)-driven defect inspection is pivotal in industrial manufacturing. Yet, many methods, tailored to specific pipelines, grapple with diverse product portfolios and evolving processes. Addressing this, we present the Incremental Unified Framework (IUF), which can reduce the feature conflict problem when continuously integrating new objects in the pipeline, making it advantageous in object-incremental learning scenarios. Employing a state-of-the-art transformer, we introduce Object-Aware Self-Attention (OASA) to delineate distinct semantic boundaries. Semantic Compression Loss (SCL) is integrated to optimize non-primary semantic space, enhancing network adaptability for novel objects. Additionally, we prioritize retaining the features of established objects during weight updates. Demonstrating prowess in both image and pixel-level defect inspection, our approach achieves state-of-the-art performance, proving indispensable for dynamic and scalable industrial inspections. Our code will be released at https://github.com/jqtangust/IUF.

Benefiting from generalizability of vision-language models (VLMs) such as CLIP, many zero-/few-shot anomaly detection (AD) approaches have achieved impressive detection performance across various datasets. Nevertheless, they require substantial training on large auxiliary datasets to adapt VLMs to anomaly detection, and their inference largely relies on visual-text embedding similarity-based anomaly scores, lacking reasoning abilities to detect complex anomalies that require in-depth contextual understanding. To address this limitation, we propose AnomalyAgent, a novel training-free, agentic framework that leverages the advanced reasoning and generalization capabilities of multimodal large language models (MLLMs) for anomaly detection. The key ingredients include 1) a comprehensive anomaly-centric toolset that enables adaptive MLLM-driven, agentic anomaly reasoning in zero-shot settings, and 2) a customized memory module that grounds anomaly reasoning with few-shot, in-context reference examples. We extend evaluation beyond the detection of simple anomalies (e.g., surface defects like cracks and dents and clear lesions) in widely used benchmarks to more diverse types of anomalies such as logical/contextual anomalies in logistics and manufacturing settings. Extensive experiment results demonstrate that our AnomalyAgent achieves substantially better performance compared to training-free VLM-based AD and generic agentic methods, highlighting its superior generalization capability in both zero-shot and few-shot anomaly detection settings. The code implementation can be find at this address.

Reliable anomaly detection in photovoltaic (PV) modules is critical for maintaining solar energy efficiency. However, developing robust computer vision models for PV inspection is constrained by the scarcity of large-scale, diverse, and balanced datasets. This study introduces PV-DDPM, a spatially conditioned denoising diffusion probabilistic model that generates anomalous electroluminescence (EL) images across four PV cell types: multi-crystalline silicon (multi-c-Si), mono-crystalline silicon (mono-c-Si), half-cut multi-c-Si, and interdigitated back contact (IBC) with dogbone interconnect. PV-DDPM enables controlled synthesis of single-defect and multi-defect scenarios by conditioning on binary masks representing structural features and defect positions. To the best of our knowledge, this is the first framework that jointly models multiple PV cell types while supporting simultaneous generation of diverse anomaly types. We also introduce E-SCDD, an enhanced version of the SCDD dataset, comprising 1,000 pixel-wise annotated EL images spanning 30 semantic classes, and 1,768 unlabeled synthetic samples. Quantitative evaluation shows our generated images achieve a Fréchet Inception Distance (FID) of 4.10 and Kernel Inception Distance (KID) of 0.0023 pm 0.0007 across all categories. Training the vision--language anomaly detection model AA-CLIP on E-SCDD, compared to the SCDD dataset, improves pixel-level AUC and average precision by 1.70 and 8.34 points, respectively.

Genuine leather, such as the hides of cows, crocodiles, lizards and goats usually contain natural and artificial defects, like holes, fly bites, tick marks, veining, cuts, wrinkles and others. A traditional solution to identify the defects is by manual defect inspection, which involves skilled experts. It is time consuming and may incur a high error rate and results in low productivity. This paper presents a series of automatic image processing processes to perform the classification of leather defects by adopting deep learning approaches. Particularly, the leather images are first partitioned into small patches,then it undergoes a pre-processing technique, namely the Canny edge detection to enhance defect visualization. Next, artificial neural network (ANN) and convolutional neural network (CNN) are employed to extract the rich image features. The best classification result achieved is 80.3 %, evaluated on a data set that consists of 2000 samples. In addition, the performance metrics such as confusion matrix and Receiver Operating Characteristic (ROC) are reported to demonstrate the efficiency of the method proposed.

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and time-consuming. To address this challenge, we propose a novel diffusion-based pipeline for generating high-fidelity industrial datasets with minimal supervision. Our approach conditions the diffusion model on enriched bounding box representations to produce precise segmentation masks, ensuring realistic and accurately localized defect synthesis. Compared to existing layout-conditioned generative methods, our approach improves defect consistency and spatial accuracy. We introduce two quantitative metrics to evaluate the effectiveness of our method and assess its impact on a downstream segmentation task trained on real and synthetic data. Our results demonstrate that diffusion-based synthesis can bridge the gap between artificial and real-world industrial data, fostering more reliable and cost-efficient segmentation models. The code is publicly available at https://github.com/covisionlab/diffusion_labeling.

In recent years, Printed Circuit Boards (PCB) have become the backbone of a large number of consumer electronic devices leading to a surge in their production. This has made it imperative to employ automatic inspection systems to identify manufacturing defects in PCB before they are installed in the respective systems. An important task in this regard is the classification of defects as either true or pseudo defects, which decides if the PCB is to be re-manufactured or not. This work proposes a novel approach to detect most common defects in the PCBs. The problem has been approached by employing highly discriminative features based on multi-scale wavelet transform, which are further boosted by using a kernalized version of the support vector machines (SVM). A real world printed circuit board dataset has been used for quantitative analysis. Experimental results demonstrated the efficacy of the proposed method.

Visual anomaly detection is essential and commonly used for many tasks in the field of computer vision. Recent anomaly detection datasets mainly focus on industrial automated inspection, medical image analysis and video surveillance. In order to broaden the application and research of anomaly detection in unmanned supermarkets and smart manufacturing, we introduce the supermarket goods anomaly detection (GoodsAD) dataset. It contains 6124 high-resolution images of 484 different appearance goods divided into 6 categories. Each category contains several common different types of anomalies such as deformation, surface damage and opened. Anomalies contain both texture changes and structural changes. It follows the unsupervised setting and only normal (defect-free) images are used for training. Pixel-precise ground truth regions are provided for all anomalies. Moreover, we also conduct a thorough evaluation of current state-of-the-art unsupervised anomaly detection methods. This initial benchmark indicates that some methods which perform well on the industrial anomaly detection dataset (e.g., MVTec AD), show poor performance on our dataset. This is a comprehensive, multi-object dataset for supermarket goods anomaly detection that focuses on real-world applications.

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the introduction and comparison of new methods. In this paper, we published a synthesized PCB dataset containing 1386 images with 6 kinds of defects for the use of detection, classification and registration tasks. Besides, we proposed a reference based method to inspect and trained an end-to-end convolutional neural network to classify the defects. Unlike conventional approaches that require pixel-by-pixel processing, our method firstly locate the defects and then classify them by neural networks, which shows superior performance on our dataset.

We present WaferSAGE, a framework for wafer defect visual question answering using small vision-language models. To address data scarcity in semiconductor manufacturing, we propose a three-stage synthesis pipeline incorporating structured rubric generation for precise evaluation. Starting from limited labeled wafer maps, we employ clustering-based cleaning to filter label noise, then generate comprehensive defect descriptions using vision-language models, which are converted into structured evaluation rubrics criteria. These rubrics guide the synthesis of VQA pairs, ensuring coverage across defect type identification, spatial distribution, morphology, and root cause analysis. Our dual assessment framework aligns rule-based metrics with LLM-Judge scores via Bayesian optimization, enabling reliable automated evaluation. Through curriculum-based reinforcement learning with Group Sequence Policy Optimization (GSPO) and rubric-aligned rewards, our 4B-parameter Qwen3-VL model achieves a 6.493 LLM-Judge score, closely approaching Gemini-3-Flash (7.149) while enabling complete on-premise deployment. We demonstrate that small models with domain-specific training can surpass proprietary large models in specialized industrial visual understanding, offering a viable path for privacy-preserving, cost-effective deployment in semiconductor manufacturing.

Deep learning has recently achieved initial success in program analysis tasks such as bug detection. Lacking real bugs, most existing works construct training and test data by injecting synthetic bugs into correct programs. Despite achieving high test accuracy (e.g., 90%), the resulting bug detectors are found to be surprisingly unusable in practice, i.e., <10% precision when used to scan real software repositories. In this work, we argue that this massive performance difference is caused by a distribution shift, i.e., a fundamental mismatch between the real bug distribution and the synthetic bug distribution used to train and evaluate the detectors. To address this key challenge, we propose to train a bug detector in two phases, first on a synthetic bug distribution to adapt the model to the bug detection domain, and then on a real bug distribution to drive the model towards the real distribution. During these two phases, we leverage a multi-task hierarchy, focal loss, and contrastive learning to further boost performance. We evaluate our approach extensively on three widely studied bug types, for which we construct new datasets carefully designed to capture the real bug distribution. The results demonstrate that our approach is practically effective and successfully mitigates the distribution shift: our learned detectors are highly performant on both our test set and the latest version of open source repositories. Our code, datasets, and models are publicly available at https://github.com/eth-sri/learning-real-bug-detector.

Anomaly detection methods identify examples that do not follow the expected behaviour, typically in an unsupervised fashion, by assigning real-valued anomaly scores to the examples based on various heuristics. These scores need to be transformed into actual predictions by thresholding, so that the proportion of examples marked as anomalies equals the expected proportion of anomalies, called contamination factor. Unfortunately, there are no good methods for estimating the contamination factor itself. We address this need from a Bayesian perspective, introducing a method for estimating the posterior distribution of the contamination factor of a given unlabeled dataset. We leverage on outputs of several anomaly detectors as a representation that already captures the basic notion of anomalousness and estimate the contamination using a specific mixture formulation. Empirically on 22 datasets, we show that the estimated distribution is well-calibrated and that setting the threshold using the posterior mean improves the anomaly detectors' performance over several alternative methods. All code is publicly available for full reproducibility.

Anomaly detection (AD) is a machine learning task that identifies anomalies by learning patterns from normal training data. In many real-world scenarios, anomalies vary in severity, from minor anomalies with little risk to severe abnormalities requiring immediate attention. However, existing models primarily operate in a binary setting, and the anomaly scores they produce are usually based on the deviation of data points from normal data, which may not accurately reflect practical severity. In this paper, we address this gap by making three key contributions. First, we propose a novel setting, Multilevel AD (MAD), in which the anomaly score represents the severity of anomalies in real-world applications, and we highlight its diverse applications across various domains. Second, we introduce a novel benchmark, MAD-Bench, that evaluates models not only on their ability to detect anomalies, but also on how effectively their anomaly scores reflect severity. This benchmark incorporates multiple types of baselines and real-world applications involving severity. Finally, we conduct a comprehensive performance analysis on MAD-Bench. We evaluate models on their ability to assign severity-aligned scores, investigate the correspondence between their performance on binary and multilevel detection, and study their robustness. This analysis offers key insights into improving AD models for practical severity alignment. The code framework and datasets used for the benchmark will be made publicly available.

Spacecraft deployed in outer space are routinely subjected to various forms of damage due to exposure to hazardous environments. In addition, there are significant risks to the subsequent process of in-space repairs through human extravehicular activity or robotic manipulation, incurring substantial operational costs. Recent developments in image segmentation could enable the development of reliable and cost-effective autonomous inspection systems. While these models often require large amounts of training data to achieve satisfactory results, publicly available annotated spacecraft segmentation data are very scarce. Here, we present a new dataset of nearly 64k annotated spacecraft images that was created using real spacecraft models, superimposed on a mixture of real and synthetic backgrounds generated using NASA's TTALOS pipeline. To mimic camera distortions and noise in real-world image acquisition, we also added different types of noise and distortion to the images. Finally, we finetuned YOLOv8 and YOLOv11 segmentation models to generate performance benchmarks for the dataset under well-defined hardware and inference time constraints to mimic real-world image segmentation challenges for real-time onboard applications in space on NASA's inspector spacecraft. The resulting models, when tested under these constraints, achieved a Dice score of 0.92, Hausdorff distance of 0.69, and an inference time of about 0.5 second. The dataset and models for performance benchmark are available at https://github.com/RiceD2KLab/SWiM.

Logical anomaly detection in industrial inspection remains challenging due to variations in visual appearance (e.g., background clutter, illumination shift, and blur), which often distract vision-centric detectors from identifying rule-level violations. However, existing benchmarks rarely provide controlled settings where logical states are fixed while such nuisance factors vary. To address this gap, we introduce VID-AD, a dataset for logical anomaly detection under vision-induced distraction. It comprises 10 manufacturing scenarios and five capture conditions, totaling 50 one-class tasks and 10,395 images. Each scenario is defined by two logical constraints selected from quantity, length, type, placement, and relation, with anomalies including both single-constraint and combined violations. We further propose a language-based anomaly detection framework that relies solely on text descriptions generated from normal images. Using contrastive learning with positive texts and contradiction-based negative texts synthesized from these descriptions, our method learns embeddings that capture logical attributes rather than low-level features. Extensive experiments demonstrate consistent improvements over baselines across the evaluated settings. The dataset is available at: https://github.com/nkthiroto/VID-AD.

The aim of surface defect detection is to identify and localise abnormal regions on the surfaces of captured objects, a task that's increasingly demanded across various industries. Current approaches frequently fail to fulfil the extensive demands of these industries, which encompass high performance, consistency, and fast operation, along with the capacity to leverage the entirety of the available training data. Addressing these gaps, we introduce SuperSimpleNet, an innovative discriminative model that evolved from SimpleNet. This advanced model significantly enhances its predecessor's training consistency, inference time, as well as detection performance. SuperSimpleNet operates in an unsupervised manner using only normal training images but also benefits from labelled abnormal training images when they are available. SuperSimpleNet achieves state-of-the-art results in both the supervised and the unsupervised settings, as demonstrated by experiments across four challenging benchmark datasets. Code: https://github.com/blaz-r/SuperSimpleNet .

Unsupervised texture anomaly detection has been a concerning topic in a vast amount of industrial processes. Patterned textures inspection, particularly in the context of fabric defect detection, is indeed a widely encountered use case. This task involves handling a diverse spectrum of colors and textile types, encompassing a wide range of fabrics. Given the extensive variability in colors, textures, and defect types, fabric defect detection poses a complex and challenging problem in the field of patterned textures inspection. In this article, we propose a knowledge distillation-based approach tailored specifically for addressing the challenge of unsupervised anomaly detection in textures resembling fabrics. Our method aims to redefine the recently introduced reverse distillation approach, which advocates for an encoder-decoder design to mitigate classifier bias and to prevent the student from reconstructing anomalies. In this study, we present a new reverse distillation technique for the specific task of fabric defect detection. Our approach involves a meticulous design selection that strategically highlights high-level features. To demonstrate the capabilities of our approach both in terms of performance and inference speed, we conducted a series of experiments on multiple texture datasets, including MVTEC AD, AITEX, and TILDA, alongside conducting experiments on a dataset acquired from a textile manufacturing facility. The main contributions of this paper are the following: a robust texture anomaly detector utilizing a reverse knowledge-distillation technique suitable for both anomaly detection and domain generalization and a novel dataset encompassing a diverse range of fabrics and defects.

We introduce AutoMonitor-Bench, the first benchmark designed to systematically evaluate the reliability of LLM-based misbehavior monitors across diverse tasks and failure modes. AutoMonitor-Bench consists of 3,010 carefully annotated test samples spanning question answering, code generation, and reasoning, with paired misbehavior and benign instances. We evaluate monitors using two complementary metrics: Miss Rate (MR) and False Alarm Rate (FAR), capturing failures to detect misbehavior and oversensitivity to benign behavior, respectively. Evaluating 12 proprietary and 10 open-source LLMs, we observe substantial variability in monitoring performance and a consistent trade-off between MR and FAR, revealing an inherent safety-utility tension. To further explore the limits of monitor reliability, we construct a large-scale training corpus of 153,581 samples and fine-tune Qwen3-4B-Instruction to investigate whether training on known, relatively easy-to-construct misbehavior datasets improves monitoring performance on unseen and more implicit misbehaviors. Our results highlight the challenges of reliable, scalable misbehavior monitoring and motivate future work on task-aware designing and training strategies for LLM-based monitors.

Visual anomaly classification and segmentation are vital for automating industrial quality inspection. The focus of prior research in the field has been on training custom models for each quality inspection task, which requires task-specific images and annotation. In this paper we move away from this regime, addressing zero-shot and few-normal-shot anomaly classification and segmentation. Recently CLIP, a vision-language model, has shown revolutionary generality with competitive zero-/few-shot performance in comparison to full-supervision. But CLIP falls short on anomaly classification and segmentation tasks. Hence, we propose window-based CLIP (WinCLIP) with (1) a compositional ensemble on state words and prompt templates and (2) efficient extraction and aggregation of window/patch/image-level features aligned with text. We also propose its few-normal-shot extension WinCLIP+, which uses complementary information from normal images. In MVTec-AD (and VisA), without further tuning, WinCLIP achieves 91.8%/85.1% (78.1%/79.6%) AUROC in zero-shot anomaly classification and segmentation while WinCLIP+ does 93.1%/95.2% (83.8%/96.4%) in 1-normal-shot, surpassing state-of-the-art by large margins.

Few-shot anomaly detection (FSAD) has emerged as a crucial yet challenging task in industrial inspection, where normal distribution modeling must be accomplished with only a few normal images. While existing approaches typically employ multi-modal foundation models combining language and vision modalities for prompt-guided anomaly detection, these methods often demand sophisticated prompt engineering and extensive manual tuning. In this paper, we demonstrate that a straightforward nearest-neighbor search framework can surpass state-of-the-art performance in both single-class and multi-class FSAD scenarios. Our proposed method, VisionAD, consists of four simple yet essential components: (1) scalable vision foundation models that extract universal and discriminative features; (2) dual augmentation strategies - support augmentation to enhance feature matching adaptability and query augmentation to address the oversights of single-view prediction; (3) multi-layer feature integration that captures both low-frequency global context and high-frequency local details with minimal computational overhead; and (4) a class-aware visual memory bank enabling efficient one-for-all multi-class detection. Extensive evaluations across MVTec-AD, VisA, and Real-IAD benchmarks demonstrate VisionAD's exceptional performance. Using only 1 normal images as support, our method achieves remarkable image-level AUROC scores of 97.4%, 94.8%, and 70.8% respectively, outperforming current state-of-the-art approaches by significant margins (+1.6%, +3.2%, and +1.4%). The training-free nature and superior few-shot capabilities of VisionAD make it particularly appealing for real-world applications where samples are scarce or expensive to obtain. Code is available at https://github.com/Qiqigeww/VisionAD.

Existing defect/anomaly generation methods often rely on few-shot learning, which overfits to specific defect categories due to the lack of large-scale paired defect editing data. This issue is aggravated by substantial variations in defect scale and morphology, resulting in limited generalization, degraded realism, and category consistency. We address these challenges by introducing UDG, a large-scale dataset of 300K normal-abnormal-mask-caption quadruplets spanning diverse domains, and by presenting UniDG, a universal defect generation foundation model that supports both reference-based defect generation and text instruction-based defect editing without per-category fine-tuning. UniDG performs Defect-Context Editing via adaptive defect cropping and structured diptych input format, and fuses reference and target conditions through MM-DiT multimodal attention. A two-stage training strategy, Diversity-SFT followed by Consistency-RFT, further improves diversity while enhancing realism and reference consistency. Extensive experiments on MVTec-AD and VisA show that UniDG outperforms prior few-shot anomaly generation and image insertion/editing baselines in synthesis quality and downstream single- and multi-class anomaly detection/localization. Code will be available at https://github.com/RetoFan233/UniDG.

Automated issue solving aims to resolve real-world issues in software repositories. The most popular benchmarks for automated issue solving are SWE-bench and its human-filtered subset SWE-bench Verified. These benchmarks leverage testing to validate generated patches. However, because testing is rarely exhaustive, a patch may pass the tests but nevertheless fail to match the developers' expectations. Unfortunately, it is currently unclear to what extent evaluations performed with SWE-bench suffer from such plausible but incorrect patches. This paper presents an in-depth empirical study of the correctness of plausible patches generated by three state-of-the-art issue-solving tools evaluated on SWE-bench Verified. We extensively test and inspect generated patches, and compare them against human-written ground truth patches. The core of our methodology is a novel technique PatchDiff for differential patch testing, which automatically exposes behavioral discrepancies between two patches. Our findings reveal critical weaknesses in SWE-bench's patch validation mechanism, which causes 7.8% of all patches to count as correct while failing the developer-written test suite. Moreover, our novel automated technique reveals that even more (29.6%) plausible patches induce different behavior than the ground truth patches. These behavioral differences are often due to similar, but divergent implementations (46.8%) and due to generated patches that adapt more behavior than the ground truth patches (27.3%). Our manual inspection shows that 28.6% of behaviorally divergent patches are certainly incorrect. Combined, the different weaknesses lead to an inflation of reported resolution rates by 6.2 absolute percent points. Our findings are a call to arms for more robust and reliable evaluation of issue-solving tools. We envision our automated differential patch testing technique to be useful for this purpose.

The emergence of new nanoscale technologies has imposed significant challenges to designing reliable electronic systems in radiation environments. A few types of radiation like Total Ionizing Dose (TID) effects often cause permanent damages on such nanoscale electronic devices, and current state-of-the-art technologies to tackle TID make use of expensive radiation-hardened devices. This paper focuses on a novel and different approach: using machine learning algorithms on consumer electronic level Field Programmable Gate Arrays (FPGAs) to tackle TID effects and monitor them to replace before they stop working. This condition has a research challenge to anticipate when the board results in a total failure due to TID effects. We observed internal measurements of the FPGA boards under gamma radiation and used three different anomaly detection machine learning (ML) algorithms to detect anomalies in the sensor measurements in a gamma-radiated environment. The statistical results show a highly significant relationship between the gamma radiation exposure levels and the board measurements. Moreover, our anomaly detection results have shown that a One-Class Support Vector Machine with Radial Basis Function Kernel has an average Recall score of 0.95. Also, all anomalies can be detected before the boards stop working.

Large Vision-Language Models (LVLMs) such as MiniGPT-4 and LLaVA have demonstrated the capability of understanding images and achieved remarkable performance in various visual tasks. Despite their strong abilities in recognizing common objects due to extensive training datasets, they lack specific domain knowledge and have a weaker understanding of localized details within objects, which hinders their effectiveness in the Industrial Anomaly Detection (IAD) task. On the other hand, most existing IAD methods only provide anomaly scores and necessitate the manual setting of thresholds to distinguish between normal and abnormal samples, which restricts their practical implementation. In this paper, we explore the utilization of LVLM to address the IAD problem and propose AnomalyGPT, a novel IAD approach based on LVLM. We generate training data by simulating anomalous images and producing corresponding textual descriptions for each image. We also employ an image decoder to provide fine-grained semantic and design a prompt learner to fine-tune the LVLM using prompt embeddings. Our AnomalyGPT eliminates the need for manual threshold adjustments, thus directly assesses the presence and locations of anomalies. Additionally, AnomalyGPT supports multi-turn dialogues and exhibits impressive few-shot in-context learning capabilities. With only one normal shot, AnomalyGPT achieves the state-of-the-art performance with an accuracy of 86.1%, an image-level AUC of 94.1%, and a pixel-level AUC of 95.3% on the MVTec-AD dataset. Code is available at https://github.com/CASIA-IVA-Lab/AnomalyGPT.

The interactive segmentation task consists in the creation of object segmentation masks based on user interactions. The most common way to guide a model towards producing a correct segmentation consists in clicks on the object and background. The recently published Segment Anything Model (SAM) supports a generalized version of the interactive segmentation problem and has been trained on an object segmentation dataset which contains 1.1B masks. Though being trained extensively and with the explicit purpose of serving as a foundation model, we show significant limitations of SAM when being applied for interactive segmentation on novel domains or object types. On the used datasets, SAM displays a failure rate FR_{30}@90 of up to 72.6 %. Since we still want such foundation models to be immediately applicable, we present a framework that can adapt SAM during immediate usage. For this we will leverage the user interactions and masks, which are constructed during the interactive segmentation process. We use this information to generate pseudo-labels, which we use to compute a loss function and optimize a part of the SAM model. The presented method causes a relative reduction of up to 48.1 % in the FR_{20}@85 and 46.6 % in the FR_{30}@90 metrics.

Autonomous vehicles require a precise understanding of their environment to navigate safely. Reliable identification of unknown objects, especially those that are absent during training, such as wild animals, is critical due to their potential to cause serious accidents. Significant progress in semantic segmentation of anomalies has been driven by the availability of out-of-distribution (OOD) benchmarks. However, a comprehensive understanding of scene dynamics requires the segmentation of individual objects, and thus the segmentation of instances is essential. Development in this area has been lagging, largely due to the lack of dedicated benchmarks. To address this gap, we have extended the most commonly used anomaly segmentation benchmarks to include the instance segmentation task. Our evaluation of anomaly instance segmentation methods shows that this challenge remains an unsolved problem. The benchmark website and the competition page can be found at: https://vision.rwth-aachen.de/oodis .

Recent advances in visual anomaly detection research have seen AUROC and AUPRO scores on public benchmark datasets such as MVTec and VisA converge towards perfect recall, giving the impression that these benchmarks are near-solved. However, high AUROC and AUPRO scores do not always reflect qualitative performance, which limits the validity of these metrics in real-world applications. We argue that the artificial ceiling imposed by the lack of an adequate evaluation metric restrains progression of the field, and it is crucial that we revisit the evaluation metrics used to rate our algorithms. In response, we introduce Per-IMage Overlap (PIMO), a novel metric that addresses the shortcomings of AUROC and AUPRO. PIMO retains the recall-based nature of the existing metrics but introduces two distinctions: the assignment of curves (and respective area under the curve) is per-image, and its X-axis relies solely on normal images. Measuring recall per image simplifies instance score indexing and is more robust to noisy annotations. As we show, it also accelerates computation and enables the usage of statistical tests to compare models. By imposing low tolerance for false positives on normal images, PIMO provides an enhanced model validation procedure and highlights performance variations across datasets. Our experiments demonstrate that PIMO offers practical advantages and nuanced performance insights that redefine anomaly detection benchmarks -- notably challenging the perception that MVTec AD and VisA datasets have been solved by contemporary models. Available on GitHub: https://github.com/jpcbertoldo/aupimo.

How much do large language models actually hallucinate when answering questions grounded in provided documents? Despite the critical importance of this question for enterprise AI deployments, reliable measurement has been hampered by benchmarks that rely on static datasets vulnerable to contamination, LLM-based judges with documented biases, or evaluation scales too small for statistical confidence. We address this gap using RIKER, a ground-truth-first evaluation methodology that enables deterministic scoring without human annotation. Across 35 open-weight models, three context lengths (32K, 128K, and 200K tokens), four temperature settings, and three hardware platforms (NVIDIA H200, AMD MI300X, and Intel Gaudi 3), we conducted over 172 billion tokens of evaluation - an order of magnitude beyond prior work. Our findings reveal that: (1) even the best-performing models fabricate answers at a non-trivial rate - 1.19% at best at 32K, with top-tier models at 5 - 7% - and fabrication rises steeply with context length, nearly tripling at 128K and exceeding 10% for all models at 200K; (2) model selection dominates all other factors, with overall accuracy spanning a 72-percentage-point range and model family predicting fabrication resistance better than model size; (3) temperature effects are nuanced - T=0.0 yields the best overall accuracy in roughly 60% of cases, but higher temperatures reduce fabrication for the majority of models and dramatically reduce coherence loss (infinite generation loops), which can reach 48x higher rates at T=0.0 versus T=1.0; (4) grounding ability and fabrication resistance are distinct capabilities - models that excel at finding facts may still fabricate facts that do not exist; and (5) results are consistent across hardware platforms, confirming that deployment decisions need not be hardware-dependent.

In the area of fewshot anomaly detection (FSAD), efficient visual feature plays an essential role in memory bank M-based methods. However, these methods do not account for the relationship between the visual feature and its rotated visual feature, drastically limiting the anomaly detection performance. To push the limits, we reveal that rotation-invariant feature property has a significant impact in industrial-based FSAD. Specifically, we utilize graph representation in FSAD and provide a novel visual isometric invariant feature (VIIF) as anomaly measurement feature. As a result, VIIF can robustly improve the anomaly discriminating ability and can further reduce the size of redundant features stored in M by a large amount. Besides, we provide a novel model GraphCore via VIIFs that can fast implement unsupervised FSAD training and can improve the performance of anomaly detection. A comprehensive evaluation is provided for comparing GraphCore and other SOTA anomaly detection models under our proposed fewshot anomaly detection setting, which shows GraphCore can increase average AUC by 5.8%, 4.1%, 3.4%, and 1.6% on MVTec AD and by 25.5%, 22.0%, 16.9%, and 14.1% on MPDD for 1, 2, 4, and 8-shot cases, respectively.

We present and test the largest benchmark for vericoding, LLM-generation of formally verified code from formal specifications - in contrast to vibe coding, which generates potentially buggy code from a natural language description. Our benchmark contains 12,504 formal specifications, with 3,029 in Dafny, 2,334 in Verus/Rust and 7,141 in Lean. Of these, 6,174 are new unseen problems. We find vericoding success rates of 27% in Lean, 44% in Verus/Rust and 82% in Dafny using off-the-shelf LLMs. Adding natural-language descriptions does not significantly improve performance. We also find that LLM progress has improved progress on pure Dafny verification from 68% to 96% over the past year. The benchmark and vericoding results are shared at https://github.com/Beneficial-AI-Foundation/vericoding-benchmark

Automated detection of software vulnerabilities is a fundamental problem in software security. Existing program analysis techniques either suffer from high false positives or false negatives. Recent progress in Deep Learning (DL) has resulted in a surge of interest in applying DL for automated vulnerability detection. Several recent studies have demonstrated promising results achieving an accuracy of up to 95% at detecting vulnerabilities. In this paper, we ask, "how well do the state-of-the-art DL-based techniques perform in a real-world vulnerability prediction scenario?". To our surprise, we find that their performance drops by more than 50%. A systematic investigation of what causes such precipitous performance drop reveals that existing DL-based vulnerability prediction approaches suffer from challenges with the training data (e.g., data duplication, unrealistic distribution of vulnerable classes, etc.) and with the model choices (e.g., simple token-based models). As a result, these approaches often do not learn features related to the actual cause of the vulnerabilities. Instead, they learn unrelated artifacts from the dataset (e.g., specific variable/function names, etc.). Leveraging these empirical findings, we demonstrate how a more principled approach to data collection and model design, based on realistic settings of vulnerability prediction, can lead to better solutions. The resulting tools perform significantly better than the studied baseline: up to 33.57% boost in precision and 128.38% boost in recall compared to the best performing model in the literature. Overall, this paper elucidates existing DL-based vulnerability prediction systems' potential issues and draws a roadmap for future DL-based vulnerability prediction research. In that spirit, we make available all the artifacts supporting our results: https://git.io/Jf6IA.

In modern Very Large Scale Integrated (VLSI) circuit design flow, the Register-Transfer Level (RTL) stage presents a critical opportunity for timing optimization. Addressing timing violations at this early stage is essential, as modern systems demand higher speeds, where even minor timing violations can lead to functional failures or system crashes. However, traditional timing optimization heavily relies on manual expertise, requiring engineers to iteratively analyze timing reports and debug. To automate this process, this paper proposes ViTAD, a method that efficiently analyzes the root causes of timing violations and dynamically generates targeted repair strategies. Specifically, we first parse Verilog code and timing reports to construct a Signal Timing Dependency Graph (STDG). Based on the STDG, we perform violation path analysis and use large language models (LLMs) to infer the root causes of violations. Finally, by analyzing the causes of violations, we selectively retrieve relevant debugging knowledge from a domain-specific knowledge base to generate customized repair solutions. To evaluate the effectiveness of our method, we construct a timing violation dataset based on real-world open-source projects. This dataset contains 54 cases of violations. Experimental results show that our method achieves a 73.68% success rate in repairing timing violations, while the baseline using only LLM is 54.38%. Our method improves the success rate by 19.30%.

Background: The C and C++ languages hold significant importance in Software Engineering research because of their widespread use in practice. Numerous studies have utilized Machine Learning (ML) and Deep Learning (DL) techniques to detect software vulnerabilities (SVs) in the source code written in these languages. However, the application of these techniques in function-level SV assessment has been largely unexplored. SV assessment is increasingly crucial as it provides detailed information on the exploitability, impacts, and severity of security defects, thereby aiding in their prioritization and remediation. Aims: We conduct the first empirical study to investigate and compare the performance of ML and DL models, many of which have been used for SV detection, for function-level SV assessment in C/C++. Method: Using 9,993 vulnerable C/C++ functions, we evaluated the performance of six multi-class ML models and five multi-class DL models for the SV assessment at the function level based on the Common Vulnerability Scoring System (CVSS). We further explore multi-task learning, which can leverage common vulnerable code to predict all SV assessment outputs simultaneously in a single model, and compare the effectiveness and efficiency of this model type with those of the original multi-class models. Results: We show that ML has matching or even better performance compared to the multi-class DL models for function-level SV assessment with significantly less training time. Employing multi-task learning allows the DL models to perform significantly better, with an average of 8-22% increase in Matthews Correlation Coefficient (MCC). Conclusions: We distill the practices of using data-driven techniques for function-level SV assessment in C/C++, including the use of multi-task DL to balance efficiency and effectiveness. This can establish a strong foundation for future work in this area.

We present a dataset of several fault types in control surfaces of a fixed-wing Unmanned Aerial Vehicle (UAV) for use in Fault Detection and Isolation (FDI) and Anomaly Detection (AD) research. Currently, the dataset includes processed data for 47 autonomous flights with 23 sudden full engine failure scenarios and 24 scenarios for seven other types of sudden control surface (actuator) faults, with a total of 66 minutes of flight in normal conditions and 13 minutes of post-fault flight time. It additionally includes many hours of raw data of fully-autonomous, autopilot-assisted and manual flights with tens of fault scenarios. The ground truth of the time and type of faults is provided in each scenario to enable evaluation of the methods using the dataset. We have also provided the helper tools in several programming languages to load and work with the data and to help the evaluation of a detection method using the dataset. A set of metrics is proposed to help to compare different methods using the dataset. Most of the current fault detection methods are evaluated in simulation and as far as we know, this dataset is the only one providing the real flight data with faults in such capacity. We hope it will help advance the state-of-the-art in Anomaly Detection or FDI research for Autonomous Aerial Vehicles and mobile robots to enhance the safety of autonomous and remote flight operations further. The dataset and the provided tools can be accessed from https://doi.org/10.1184/R1/12707963.

Industrial anomaly detection is generally addressed as an unsupervised task that aims at locating defects with only normal training samples. Recently, numerous 2D anomaly detection methods have been proposed and have achieved promising results, however, using only the 2D RGB data as input is not sufficient to identify imperceptible geometric surface anomalies. Hence, in this work, we focus on multi-modal anomaly detection. Specifically, we investigate early multi-modal approaches that attempted to utilize models pre-trained on large-scale visual datasets, i.e., ImageNet, to construct feature databases. And we empirically find that directly using these pre-trained models is not optimal, it can either fail to detect subtle defects or mistake abnormal features as normal ones. This may be attributed to the domain gap between target industrial data and source data.Towards this problem, we propose a Local-to-global Self-supervised Feature Adaptation (LSFA) method to finetune the adaptors and learn task-oriented representation toward anomaly detection.Both intra-modal adaptation and cross-modal alignment are optimized from a local-to-global perspective in LSFA to ensure the representation quality and consistency in the inference stage.Extensive experiments demonstrate that our method not only brings a significant performance boost to feature embedding based approaches, but also outperforms previous State-of-The-Art (SoTA) methods prominently on both MVTec-3D AD and Eyecandies datasets, e.g., LSFA achieves 97.1% I-AUROC on MVTec-3D, surpass previous SoTA by +3.4%.

APR (Automated Program Repair) aims to automatically locate program defects, generate patches and validate the repairs. Existing techniques for APR are often combined with LLMs (Large Language Models), which leverages the code-related knowledge of LLMs to improve repair effectiveness. Current LLM-based APR methods typically utilize test cases only during the inference stage, adopting an iterative approach that performs repair first and validates it through test execution afterward. This conventional paradigm neglects two important aspects: the potential contribution of test cases in the training phase, and the possibility of leveraging testing prior to repair. To address this, we propose Repair-R1, which introduces test cases into the model's training phase and shifts test generation to precede repair. The model is required to first generate discriminative test cases that can distinguish defective behaviors, and then perform repair based on these tests. This enables the model to better locate defects and understand the underlying causes of defects, thereby improving repair effectiveness. We implement Repair-R1 with three different backbone models, using RL (reinforcement learning) to co-optimize test generation and bug repair. Experimental results on four widely adopted benchmarks demonstrate the superiority of Repair-R1. Specially, compared to vanilla models, Repair-R1 improves repair success rate by 2.68\% to 48.29\%, test generation success rate by 16.38\% to 53.28\%, and test coverage by 0.78\% to 53.96\%. We publish the code and weights at https://github.com/Tomsawyerhu/APR-RL and https://huggingface.co/tomhu/Qwen3-4B-RL-5000-step.

Large language models (LLMs) have been widely applied to assist test generation with the source code under test provided as the context. This paper aims to answer the question: If the source code under test is incorrect, will LLMs be misguided when generating tests? The effectiveness of test cases is measured by their accuracy, coverage, and bug detection effectiveness. Our evaluation results with five open- and six closed-source LLMs on four datasets demonstrate that incorrect code can significantly mislead LLMs in generating correct, high-coverage, and bug-revealing tests. For instance, in the HumanEval dataset, LLMs achieve 80.45% test accuracy when provided with task descriptions and correct code, but only 57.12% when given task descriptions and incorrect code. For the APPS dataset, prompts with correct code yield tests that detect 39.85% of the bugs, while prompts with incorrect code detect only 19.61%. These findings have important implications for the deployment of LLM-based testing: using it on mature code may help protect against future regression, but on early-stage immature code, it may simply bake in errors. Our findings also underscore the need for further research to improve LLMs resilience against incorrect code in generating reliable and bug-revealing tests.

We discuss how VMware is solving the following challenges to harness data to operate our ML-based anomaly detection system to detect performance issues in our Software Defined Data Center (SDDC) enterprise deployments: (i) label scarcity and label bias due to heavy dependency on unscalable human annotators, and (ii) data drifts due to ever-changing workload patterns, software stack and underlying hardware. Our anomaly detection system has been deployed in production for many years and has successfully detected numerous major performance issues. We demonstrate that by addressing these data challenges, we not only improve the accuracy of our performance anomaly detection model by 30%, but also ensure that the model performance to never degrade over time.